Study of charged defects in CdTe and CdHgTe by scanning electron and tunneling microscopy techniques
| dc.contributor.author | Panin, G. N. | |
| dc.contributor.author | Díaz-Guerra Viejo, Carlos | |
| dc.contributor.author | Piqueras De Noriega, Francisco Javier | |
| dc.date.accessioned | 2023-06-20T19:02:10Z | |
| dc.date.available | 2023-06-20T19:02:10Z | |
| dc.date.issued | 1998-03 | |
| dc.description.department | Depto. de Física de Materiales | |
| dc.description.faculty | Fac. de Ciencias Físicas | |
| dc.description.refereed | TRUE | |
| dc.description.status | pub | |
| dc.eprint.id | https://eprints.ucm.es/id/eprint/26377 | |
| dc.identifier.issn | 1026-3489 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14352/59144 | |
| dc.issue.number | 3 | |
| dc.journal.title | Izvestiya Akademii Nauk Seriya Fizicheskaya | |
| dc.page.final | 466 | |
| dc.page.initial | 461 | |
| dc.publisher | Mezhdunarodnaya Kniga | |
| dc.rights.accessRights | metadata only access | |
| dc.subject.cdu | 538.9 | |
| dc.subject.keyword | Si(111)2x1 Surface | |
| dc.subject.keyword | Spectroscopy | |
| dc.subject.keyword | Cathodoluminescence | |
| dc.subject.ucm | Física de materiales | |
| dc.title | Study of charged defects in CdTe and CdHgTe by scanning electron and tunneling microscopy techniques | |
| dc.type | journal article | |
| dc.volume.number | 62 | |
| dspace.entity.type | Publication | |
| relation.isAuthorOfPublication | b1b44979-3a0d-45d7-aa26-a64b0dbfee18 | |
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