Electrical characterization of ZnO ceramics by scanning tunneling spectroscopy and beam-induced current in the scanning tunneling microscope
| dc.contributor.author | Díaz-Guerra Viejo, Carlos | |
| dc.contributor.author | Piqueras De Noriega, Francisco Javier | |
| dc.date.accessioned | 2023-06-20T19:01:52Z | |
| dc.date.available | 2023-06-20T19:01:52Z | |
| dc.date.issued | 1999-08-15 | |
| dc.description | © 1999 American Institute of Physics. This work was supported by DGES through Project PB96-0639. | |
| dc.description.abstract | A correlative study of the electrically active grain boundary structure of ZnO polycrystals has been carried out using a scanning electron microscope/scanning tunneling microscope (SEM/STM) combined instrument. Current imaging tunneling spectroscopy (CITS) measurements reveal reduced surface band gaps, as compared with grain interiors, at the charged boundaries imaged by SEM-based remote electron beam induced current (REBIC). ZnO grain boundaries were also imaged in the STM-REBIC mode with a resolution of up to 20 nm. The contrast differences observed in the SEM-REBIC and STM-REBIC images are discussed in terms of the different experimental conditions used in both techniques. | |
| dc.description.department | Depto. de Física de Materiales | |
| dc.description.faculty | Fac. de Ciencias Físicas | |
| dc.description.refereed | TRUE | |
| dc.description.sponsorship | DGES | |
| dc.description.status | pub | |
| dc.eprint.id | https://eprints.ucm.es/id/eprint/26360 | |
| dc.identifier.doi | 10.1063/1.370982 | |
| dc.identifier.issn | 0021-8979 | |
| dc.identifier.officialurl | http://dx.doi.org/10.1063/1.370982 | |
| dc.identifier.relatedurl | http://scitation.aip.org | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14352/59135 | |
| dc.issue.number | 4 | |
| dc.journal.title | Journal of Applied Physics | |
| dc.language.iso | eng | |
| dc.page.final | 1877 | |
| dc.page.initial | 1874 | |
| dc.publisher | American Institute of Physics | |
| dc.relation.projectID | PB96-0639 | |
| dc.rights.accessRights | open access | |
| dc.subject.cdu | 538.9 | |
| dc.subject.keyword | Electronic-Structure | |
| dc.subject.keyword | Si(111)2x1 Surface | |
| dc.subject.keyword | Grain-Boundaries | |
| dc.subject.ucm | Física de materiales | |
| dc.title | Electrical characterization of ZnO ceramics by scanning tunneling spectroscopy and beam-induced current in the scanning tunneling microscope | |
| dc.type | journal article | |
| dc.volume.number | 86 | |
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| dspace.entity.type | Publication | |
| relation.isAuthorOfPublication | b1b44979-3a0d-45d7-aa26-a64b0dbfee18 | |
| relation.isAuthorOfPublication | 68dabfe9-5aec-4207-bf8a-0851f2e37e2c | |
| relation.isAuthorOfPublication.latestForDiscovery | b1b44979-3a0d-45d7-aa26-a64b0dbfee18 |
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