Characterization of semiinsulating GaAs - Cr by scanning electron acoustic microscopy
dc.contributor.author | Méndez Martín, María Bianchi | |
dc.contributor.author | Piqueras De Noriega, Francisco Javier | |
dc.date.accessioned | 2023-06-20T18:57:29Z | |
dc.date.available | 2023-06-20T18:57:29Z | |
dc.date.issued | 1991-12 | |
dc.description | © Editions Physique. International Workshop on Beam Injection Assessment of defects in Semiconductors (2. 1991. Meudon, France ) | |
dc.description.department | Depto. de Física de Materiales | |
dc.description.faculty | Fac. de Ciencias Físicas | |
dc.description.refereed | TRUE | |
dc.description.status | pub | |
dc.eprint.id | https://eprints.ucm.es/id/eprint/25072 | |
dc.identifier.doi | 10.1051/jp4:1991644 | |
dc.identifier.issn | 1155-4339 | |
dc.identifier.officialurl | http://hal.archives-ouvertes.fr/docs/00/25/07/30/PDF/ajp-jp4199101C644.pdf | |
dc.identifier.relatedurl | http://hal.archives-ouvertes.fr | |
dc.identifier.uri | https://hdl.handle.net/20.500.14352/58996 | |
dc.issue.number | C6 | |
dc.journal.title | Journal de Physique IV | |
dc.language.iso | eng | |
dc.page.final | 296 | |
dc.page.initial | 295 | |
dc.publisher | Editions Physique | |
dc.rights.accessRights | open access | |
dc.subject.cdu | 538.9 | |
dc.subject.ucm | Física de materiales | |
dc.title | Characterization of semiinsulating GaAs - Cr by scanning electron acoustic microscopy | |
dc.type | journal article | |
dc.volume.number | 1 | |
dcterms.references | 1) J.F. Bresse and A.C. Papadopoulo, J. Appl. Phys. 64, 98 (1988) 2) B. M6ndez and J. Piqueras, Inst. Phys. Conf. Ser. No. 100, 789 (1989) 3) B. M6ndez and J. Piqueras, J. Appl. Phys. 69, 2276 (1991 | |
dspace.entity.type | Publication | |
relation.isAuthorOfPublication | 465cfd5b-6dd4-4a48-a6e3-160df06f7046 | |
relation.isAuthorOfPublication | 68dabfe9-5aec-4207-bf8a-0851f2e37e2c | |
relation.isAuthorOfPublication.latestForDiscovery | 465cfd5b-6dd4-4a48-a6e3-160df06f7046 |
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