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Scanning electron‐acoustic microscopy of MgO crystals

dc.contributor.authorUrchulutegui, M.
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorLLopis, J.
dc.date.accessioned2023-06-20T19:08:34Z
dc.date.available2023-06-20T19:08:34Z
dc.date.issued1989-04-01
dc.description© American Institute of Physics. This work has been supported by the Wolkswagen Foundation and by the Comision Interministerial de Ciencia y Tecnología (Project PB86-0151). The assistance of the Departament of Materials for Electrical and Electronic Engineering of the University of Duisburg (G.F.R.)has made possible the development of the SEAN technique in our laboratory. Special thanks are due to Professor E. Kubalek and Dipl. Phys, N. Kultscher. The help of P. Fernández in this work is acknoawledged.
dc.description.abstractThe capability of scanning electron‐acoustic microscopy in the characterization of MgO crystals has been studied. The conditions for the observation of different surface and subsurface features in as‐grown and deformed crystals are described and the results are discussed on the basis of thermal and nonthermal mechanisms of acoustic signalgeneration.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipVolkswagen Froindation
dc.description.sponsorshipComisión Interministerial de Ciencia y Tecnología
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/27098
dc.identifier.doi10.1063/1.342751
dc.identifier.issn0021-8979
dc.identifier.officialurlhttp://dx.doi.org/10.1063/1.342751
dc.identifier.relatedurlhttp://scitation.aip.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59305
dc.issue.number7
dc.journal.titleJournal of Applied Physics
dc.language.isoeng
dc.page.final2680
dc.page.initial2677
dc.publisherAmerican Institute of Physics
dc.relation.projectIDPB6-0151
dc.rights.accessRightsopen access
dc.subject.cdu538.9
dc.subject.keywordPhysics
dc.subject.keywordApplied
dc.subject.ucmFísica de materiales
dc.titleScanning electron‐acoustic microscopy of MgO crystals
dc.typejournal article
dc.volume.number65
dcterms.references1. E. Brandis and A. Rosencwaig Appl. Phys. Lett. 37, 98 (1980). 2. G. S. Cargill, Nature 286, 691 (1980). 3. A. Rosencwaing, Annu. Rev. Mater. Sic. 15,1.3 (1985). 4. L. J. Balk, Can. J. Phys. 64, 1238 (1986). 5. D. G. Davis, Philos. Trans. R. Soc. London Ser. A. 320, 243 (1986). 6. D. G. Davis, Scanning Electron Microsc. III 1163 (1983). 7. J. Llopis , J. Piqueras, and L. Brú, J. Mater Sci 1361 (1978). 8. J. Piqueras, J. Llopis, and L. Delgado, J. ppl Phys. 52,4341 (1981). 9. C. Caballeros, J. Llopis, and Appl. Phys. 5453, 3201(1982). 10. J. Llopis and J. Piqueras, J. Appl. Phys. 54, 4570 (1983). 11. L. J. Balk and N. Kultscher, Ins. Phys. Conf. Ser. 67,387 (1983). 12. J. Llopis and J. Piqueras , Phys Status Solidi A 49, K9 (1978). 13. J. Opsal and A. Rosencwaig, J. Appl. Phys. 53, 4240 (1982). 14. N. Kultscher and L. J. Balk, Scannig Electron Microsc. I, 33 (1986). 15. L. J. Balk, D. G. Davies, and N. Kultscher, Phys. Status Solidi A. 82, 23 (1984). 16. J. C. Murphy, J. Maclachlan, and L.C. Aamodt, IEEE Trans. Ultrason. Ferroelectri. Frec. Control. UFFC-33, 529 (1986). 17. A. Remón, J. Piqueras, J. Llopis, and C. Ballesteros, Phys. Status solidi A 77, K29 (1983). 18. W. L. Holstein, J. Electron Microsc. Tech. 5,91 (1987). 19. T. Ikoma, M. Murayama, and K. Morizuza, Jpn. J. Appl. Phys 23, Suppl. 23-1, 194 (1983). 20 L. J., D. G. Davies, and N. Kultscher, Scanning Electron Microsc. III, 1601 (1984).
dspace.entity.typePublication
relation.isAuthorOfPublication68dabfe9-5aec-4207-bf8a-0851f2e37e2c
relation.isAuthorOfPublication.latestForDiscovery68dabfe9-5aec-4207-bf8a-0851f2e37e2c

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