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Laser tests on a power operational amplifier

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dc.conference.date19/09/2011-23/09/2011
dc.conference.placeSevilla (Spain)
dc.conference.title12th European Conference on Radiation and its Effects on Components and Systems (RADECS) 2011
dc.contributor.authorPalomar Trives, Carlos
dc.contributor.authorLópez Calle, Isabel
dc.contributor.authorFranco Peláez, Francisco Javier
dc.contributor.authorGonzález Izquierdo, Jesús
dc.contributor.authorAgapito Serrano, Juan Andrés
dc.date.accessioned2023-06-20T06:04:08Z
dc.date.available2023-06-20T06:04:08Z
dc.date.issued2011-09-19
dc.description©2011, IEEE ISSN : 0379-6566 Print ISBN: 978-1-4577-0585-4 European Conference on Radiation and its Effects on Components and Systems (RADECS. 2011) (12. 2011. Sevilla, España)
dc.description.abstractLaser tests on a power operational amplifier were performed to investigate its sensitivity to single event transients. These tests apparently point out to this device being quite insensitive to single event transients so it would become a good candidate to develop power systems to be used in radiation environments.
dc.description.departmentDepto. de Estructura de la Materia, Física Térmica y Electrónica
dc.description.departmentDepto. de Química Física
dc.description.facultyFac. de Ciencias Físicas
dc.description.facultyFac. de Ciencias Químicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Educación y Ciencia
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/28934
dc.identifier.relatedurlhttp://dx.doi.org/10.1109/RADECS.2011.6131322
dc.identifier.urihttps://hdl.handle.net/20.500.14352/45920
dc.language.isoeng
dc.page.final893
dc.page.initial889
dc.relation.projectIDAYA2009-13300-C03-02
dc.relation.projectIDConsolider SAUUL CSD2007-00013
dc.rights.accessRightsopen access
dc.subject.cdu537.8
dc.subject.keywordIntegrated circuit testing
dc.subject.keywordLaser beam applications
dc.subject.keywordOperational amplifiers
dc.subject.keywordPower amplifiers
dc.subject.keywordRadiation effects
dc.subject.keywordLaser test
dc.subject.keywordPower operational amplifier
dc.subject.keywordPower system
dc.subject.keywordRadiation environments
dc.subject.keywordSingle event transients
dc.subject.keywordJunctions
dc.subject.keywordLasers
dc.subject.keywordPower supplies
dc.subject.keywordResistors
dc.subject.keywordTransient analysis
dc.subject.keywordTransistors
dc.subject.keywordLaser irradiation
dc.subject.keywordOPA541
dc.subject.keywordPower devices
dc.subject.keywordSingle-photon absorption
dc.subject.ucmElectrónica (Física)
dc.subject.ucmÓptica (Física)
dc.subject.ucmCircuitos integrados
dc.subject.unesco2209.19 Óptica Física
dc.subject.unesco2203.07 Circuitos Integrados
dc.titleLaser tests on a power operational amplifier
dc.typeconference paper
dspace.entity.typePublication
relation.isAuthorOfPublication662ba05f-c2fc-4ad7-9203-36924c80791a
relation.isAuthorOfPublication.latestForDiscovery662ba05f-c2fc-4ad7-9203-36924c80791a

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