A comparative study of anodic tantalum pentoxide and high-pressure sputtered titanium oxide
| dc.contributor.author | Martil De La Plaza, Ignacio | |
| dc.contributor.author | González Díaz, Germán | |
| dc.contributor.author | Prado Millán, Álvaro Del | |
| dc.contributor.author | San Andrés Serrano, Enrique | |
| dc.date.accessioned | 2023-06-20T10:44:59Z | |
| dc.date.available | 2023-06-20T10:44:59Z | |
| dc.date.issued | 2003-05 | |
| dc.description | International Conference on Materials for Microelectronics and Nanoengineering (4. 2002. Espoo, Finlandia). © 2003 Kluwer Academic Publishers. | |
| dc.description.abstract | In this work we present a new method to fabricate improved TiO2 films by using a high-pressure sputtering system. In order to minimize the damage induced in the substrate surface by the ion bombardment, a high chamber pressure of 100 Pa is used, which is very much higher than typical values in conventional systems. We present results obtained by Xray diffraction and FTIR spectroscopy. Moreover, we will compare the properties of the resulting TiO2-insulator-metal capacitors with those of anodic Ta2O5. Very thin films of TiO2 have been obtained with a very promising quality for future electron device fabrication. | |
| dc.description.department | Depto. de Estructura de la Materia, Física Térmica y Electrónica | |
| dc.description.faculty | Fac. de Ciencias Físicas | |
| dc.description.refereed | TRUE | |
| dc.description.status | pub | |
| dc.eprint.id | https://eprints.ucm.es/id/eprint/26170 | |
| dc.identifier.doi | 10.1023/A:1023952718281 | |
| dc.identifier.issn | 0957-4522 | |
| dc.identifier.officialurl | http://dx.doi.org/10.1023/A:1023952718281 | |
| dc.identifier.relatedurl | http://link.springer.com | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14352/51140 | |
| dc.issue.number | 5-7 | |
| dc.journal.title | Journal of Materials Science: Materials in Electronics | |
| dc.language.iso | eng | |
| dc.page.final | 378 | |
| dc.page.initial | 375 | |
| dc.publisher | Kluwer Academic Publ. | |
| dc.rights.accessRights | open access | |
| dc.subject.cdu | 537 | |
| dc.subject.keyword | Thin-Films | |
| dc.subject.keyword | Fabrication. | |
| dc.subject.ucm | Electricidad | |
| dc.subject.ucm | Electrónica (Física) | |
| dc.subject.unesco | 2202.03 Electricidad | |
| dc.title | A comparative study of anodic tantalum pentoxide and high-pressure sputtered titanium oxide | |
| dc.type | journal article | |
| dc.volume.number | 14 | |
| dcterms.references | 1. S. Dueñas, H. Castán, J. Barbolla, R. R. Kola and P. A. Sullivan, J. Mater. Sci. Mater. Electron., 10 (1999) 379. 2. S. Dueñas, H. Castán, J. Barbolla, R. R. Kola and P. A. Sullivan, Mater. Res. Soc. Symp. Proc., 567 (1999) 371. 3. S. Dueñas, H. Castán, J. Barbolla, R. R. Kola and P. A. Sullivan, J. Mater. Sci. Mater. Electron., 12 (2001) 317. 4. S. Dueñas, H. Castán, J. Barbolla, R. R. Kola and P. A. Sullivan, Solid-State Electron., 45 (2001) 1441. 5. S. Zhang, Y. F. Zhu and D. E. Brodie, Thin Solid Films, 213 (1992) 265. 6. M. Gartner, C. Parlog and P. Osiceanu, ibid., 234 (1993) 561. 7. H. Tang, K. Prasad, R. Sanjinès, P. E. Schmid and F. Lévy, J. Appl. Phys., 75 (1994) 2002. 8. D. Mardare, M. Tasca, M. Delibas and G. I. Rusu, Appl. Surf. Sci., 156 (2000) 200. 9. Hiroshi Haruta Ltd, “Agilent Technologies Impedance Measurement Handbook”, 2nd Edn. (Agilent Technologies Co., 2002). 10. A. G. Gaynor, R. J. González, R. M. Davis and R. Zallen, J. Mater. Res., 12 (1997) 1755. 11. R. J. González, Ph.D. Dissertation, Virginia Polytechnic Institute (1996). | |
| dspace.entity.type | Publication | |
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| relation.isAuthorOfPublication.latestForDiscovery | a5ab602d-705f-4080-b4eb-53772168a203 |
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