Study of electronic deep levels in CdTe and CdTe:V by cathodoluminescence microscopy

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dc.book.titleElectron Microscopy 1994, Vols 2a and 2b: Applications in Materials Sciences
dc.contributor.authorPal, U.
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorFernández Sánchez, Paloma
dc.contributor.authorSerrano, M. D.
dc.contributor.authorDiéguez, E.
dc.date.accessioned2023-06-20T21:09:49Z
dc.date.available2023-06-20T21:09:49Z
dc.date.issued1994
dc.description© Editions Physique. International Congress on Electron Microscopy (13. 1994. París)
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26993
dc.identifier.isbn2-86883-226-1
dc.identifier.urihttps://hdl.handle.net/20.500.14352/60861
dc.page.final1132
dc.page.initial1131
dc.page.total2
dc.publisherEditions Physique
dc.rights.accessRightsmetadata only access
dc.subject.cdu538.9
dc.subject.keywordMaterials Science
dc.subject.keywordMultidisciplinary
dc.subject.keywordMicroscopy
dc.subject.ucmFísica de materiales
dc.titleStudy of electronic deep levels in CdTe and CdTe:V by cathodoluminescence microscopy
dc.typebook part
dspace.entity.typePublication
relation.isAuthorOfPublication68dabfe9-5aec-4207-bf8a-0851f2e37e2c
relation.isAuthorOfPublicationdaf4b879-c4a8-4121-aaff-e6ba47195545
relation.isAuthorOfPublication.latestForDiscoverydaf4b879-c4a8-4121-aaff-e6ba47195545
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