Study of electronic deep levels in CdTe and CdTe:V by cathodoluminescence microscopy
| dc.book.title | Electron Microscopy 1994, Vols 2a and 2b: Applications in Materials Sciences | |
| dc.contributor.author | Pal, U. | |
| dc.contributor.author | Piqueras De Noriega, Francisco Javier | |
| dc.contributor.author | Fernández Sánchez, Paloma | |
| dc.contributor.author | Serrano, M. D. | |
| dc.contributor.author | Diéguez, E. | |
| dc.date.accessioned | 2023-06-20T21:09:49Z | |
| dc.date.available | 2023-06-20T21:09:49Z | |
| dc.date.issued | 1994 | |
| dc.description | © Editions Physique. International Congress on Electron Microscopy (13. 1994. París) | |
| dc.description.department | Depto. de Física de Materiales | |
| dc.description.faculty | Fac. de Ciencias Físicas | |
| dc.description.refereed | TRUE | |
| dc.description.status | pub | |
| dc.eprint.id | https://eprints.ucm.es/id/eprint/26993 | |
| dc.identifier.isbn | 2-86883-226-1 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14352/60861 | |
| dc.page.final | 1132 | |
| dc.page.initial | 1131 | |
| dc.page.total | 2 | |
| dc.publisher | Editions Physique | |
| dc.rights.accessRights | metadata only access | |
| dc.subject.cdu | 538.9 | |
| dc.subject.keyword | Materials Science | |
| dc.subject.keyword | Multidisciplinary | |
| dc.subject.keyword | Microscopy | |
| dc.subject.ucm | Física de materiales | |
| dc.title | Study of electronic deep levels in CdTe and CdTe:V by cathodoluminescence microscopy | |
| dc.type | book part | |
| dspace.entity.type | Publication | |
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