Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model

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dc.contributor.authorBalakrishnan, Narayanaswamy
dc.contributor.authorCastilla González, Elena María
dc.contributor.authorMartín Apaolaza, Nirian
dc.contributor.authorPardo Llorente, Leandro
dc.date.accessioned2024-01-17T18:31:26Z
dc.date.available2024-01-17T18:31:26Z
dc.date.issued2020-09
dc.description.abstractClassical inferential methods for one-shot device testing data from an accelerated life-test are based on maximum likelihood estimators (MLEs) of model parameters. However, the lack of robustness of MLE is well-known. In this article, we develop robust estimators for one-shot device testing by assuming a Weibull distribution as a lifetime model. Wald-type tests based on these estimators are also developed. Their robustness properties are evaluated both theoretically and empirically, through an extensive simulation study. Finally, the methods of inference proposed are applied to three numerical examples. Results obtained from both Monte Carlo simulations and numerical studies show the proposed estimators to be a robust alternative to MLEs.
dc.description.departmentDepto. de Estadística e Investigación Operativa
dc.description.facultyFac. de Ciencias Matemáticas
dc.description.refereedTRUE
dc.description.statuspub
dc.identifier.citationN. Balakrishnan, E. Castilla, N. Martín and L. Pardo, "Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model," in IEEE Transactions on Reliability, vol. 69, no. 3, pp. 937-953, Sept. 2020, doi: 10.1109/TR.2019.2954385.
dc.identifier.doi10.1109/TR.2019.2954385
dc.identifier.officialurlhttps://ieeexplore.ieee.org/document/8922869
dc.identifier.urihttps://hdl.handle.net/20.500.14352/93697
dc.issue.number3
dc.journal.titleIEEE Transactions on Reliability
dc.language.isoeng
dc.page.final953
dc.page.initial937
dc.publisherInstitute of Electrical and Electronics Engineers
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internationalen
dc.rights.accessRightsopen access
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subject.keywordExponential distribution
dc.subject.keywordMinimum density power divergence (DPD) estimator
dc.subject.keywordOne-shot devices
dc.subject.keywordRobustness
dc.subject.keywordWald-type tests
dc.subject.ucmCiencias
dc.subject.unesco1209 Estadística
dc.titleRobust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model
dc.typejournal article
dc.volume.number69
dspace.entity.typePublication
relation.isAuthorOfPublication9a67ded0-2436-44f5-bdc9-07033ae6f956
relation.isAuthorOfPublication1705b043-bb96-4d44-8e13-1c2238cf1717
relation.isAuthorOfPublicationa6409cba-03ce-4c3b-af08-e673b7b2bf58
relation.isAuthorOfPublication.latestForDiscovery9a67ded0-2436-44f5-bdc9-07033ae6f956
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