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Luminescence from erbium oxide grown on silicon

dc.book.titleProgress in Semiconductor Materials for Optoelectronic Applications
dc.contributor.authorNogales Díaz, Emilio
dc.contributor.authorMéndez Martín, María Bianchi
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorPlugaru, R
dc.contributor.authorGarcía, J. A.
dc.contributor.authorTate, T. J.
dc.date.accessioned2023-06-20T21:08:44Z
dc.date.available2023-06-20T21:08:44Z
dc.date.issued2002
dc.description© 2002 Materials Research Society. Conference on Progress in Semiconductor Materials for Optoelectron Applications held at the 2001 MRS Fall Meeting. (2001. Boston). This work was supported by DGI (project MAT2001-2119) and by the Scientific Cooperation Program between Spain and Romania.
dc.description.abstractThe luminescence properties of erbium oxide grown on crystalline and amorphous silicon substrates were studied by means of photo- and cathodoluminescence techniques. Differences in the luminescence spectra for samples grown on the two type., of substrates used are explained in terms of the different types of erbium centers formed by taking into account the substrate properties and the thermal treatments during growth. For comparison, erbium implanted and oxygen coimplanted crystalline and amorphous silicon have been also investigated by luminescence techniques. In the implanted samples, the sharp transitions from erbium ions in the visible range were quenched and the main emission corresponds to the intraionic transitions in Er3+ ions in the infrared range peaked at 1,54 mum.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipDGI
dc.description.sponsorshipScientific Cooperation Program between Spain and Romania
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/24563
dc.identifier.isbn1-55899-628-1
dc.identifier.issn0272-9172
dc.identifier.officialurlhttp://dx.doi.org/10.1557/PROC-692-H9.14.1
dc.identifier.relatedurlhttp://journals.cambridge.org/
dc.identifier.relatedurlhttp://www.dtic.mil/cgi-bin/GetTRDoc?Location=U2&doc=GetTRDoc.pdf&AD=ADP012647
dc.identifier.urihttps://hdl.handle.net/20.500.14352/60812
dc.issue.number692
dc.journal.titleProgress in Semiconductor Materials for Optoelectronic Applications
dc.page.final460
dc.page.initial455
dc.page.total6
dc.publisherMaterials Research Society
dc.relation.ispartofseriesMRS Online Proceedings Library
dc.relation.projectIDMAT2001-2119
dc.rights.accessRightsmetadata only access
dc.subject.cdu538.9
dc.subject.keywordEr
dc.subject.keywordSi
dc.subject.keywordPhotoluminescence
dc.subject.ucmFísica de materiales
dc.titleLuminescence from erbium oxide grown on silicon
dc.typebook part
dcterms.references1. M. Fujii, M. Yoshida, S. Hayashi, and K. Yamamoto, J.Appl. Phys. 84, 4525 (1998). 2. P.H. Citrin, P.A. Northrup, R. Birkhahn and A.J. Steckl, Appl. Phys. Lett. 76, 2865 (2000). 3. J. Michel, J. L. Benton, R. F. Ferrante, D. C. Jacobson, D. J. Eaglesham, J. Appl. Phys. 70,2672 (1991). 459 4. A. Kasuya and M. Suezawa, Appl. Phys. Lett. 71, 2728 (1997). 5. H. Przybylinska, W. Jantsch, Yu. Suprun-Belevitch, M. Stepikhova, L. Palmetshofer, G. Hendorfer, A. Kozanecki, R.J. Wilson, B.J. Sealy, Phys. Rev. B 54,2532 (1996). 6. A. Polman, J. Appl. Phys. 82, 1 (1997). 7. J. Heikenfeld, D.S. Lee, M. Garter, R.Birkhahn, and A.J. Stecki, Appl. Phys. Left. 76, (2000). 8. A.R.Zanatta, C.T.M.Ribeiro, and U. Jahn, Appl. Phys. Lett. 79, 488 (2001). 9. E. Nogales, B. M6ndez, J. Piqueras, R. Plugaru, A. Coraci and J. A. Garcia, (to be published). 10. N. Jaba, A. Kanoun, H. Mejri, A. Selmi, S. Alaya, and H. Maaref, J. Phys: Condens. Matter, 12, 4523 (2000).
dspace.entity.typePublication
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