Optical method for the surface topographic characterization of Fresnel lenses
| dc.book.title | Optical Fabrication, Testing and Metrology IV | |
| dc.contributor.author | Martínez Antón, Juan Carlos | |
| dc.contributor.author | Gómez Pedrero, José Antonio | |
| dc.contributor.author | Alonso Fernández, José | |
| dc.contributor.author | Quiroga Mellado, Juan Antonio | |
| dc.date.accessioned | 2023-06-20T05:45:35Z | |
| dc.date.available | 2023-06-20T05:45:35Z | |
| dc.date.issued | 2011 | |
| dc.description | © 2011 SPIE--The International Society for Optical Engineering. Conference on Optical Fabrication, Testing, and Metrology (4ª. Marsella. Francia) | |
| dc.description.abstract | Fresnel lenses and other faceted or micro-optic devices are increasingly used in multiple applications like solar light concentrators and illumination devices. As applications are more exigent this characterization is of increasing importance. We present a technique to characterize the surface topography of optical surfaces. It is especially well adapted to Fresnel lenses where abrupt surface slopes are usually difficult to handle in conventional techniques. The method is based on a new photometric strategy able to codify the height information in terms of optical absorption in a liquid. A detailed topographic map is simple to acquire by capturing images of the surface. Some experimental results are presented. A single pixel height resolution of similar to 0.1 mu m is achieved for a height range of similar to 50 mu m. A surface slope analysis is also made achieving a resolution of similar to +/- 0.15 degrees. | |
| dc.description.department | Depto. de Óptica | |
| dc.description.faculty | Fac. de Ciencias Físicas | |
| dc.description.refereed | TRUE | |
| dc.description.status | pub | |
| dc.eprint.id | https://eprints.ucm.es/id/eprint/22733 | |
| dc.identifier.doi | 10.1117/12.896952 | |
| dc.identifier.isbn | 978-0-81948-795-7 | |
| dc.identifier.officialurl | http://proceedings.spiedigitallibrary.org/ | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14352/45468 | |
| dc.publisher | SPIE--The International Society for Optical Engineering | |
| dc.rights.accessRights | metadata only access | |
| dc.subject.cdu | 535 | |
| dc.subject.keyword | Absorption | |
| dc.subject.keyword | Interferometry | |
| dc.subject.keyword | Profilometry | |
| dc.subject.ucm | Óptica (Física) | |
| dc.subject.unesco | 2209.19 Óptica Física | |
| dc.title | Optical method for the surface topographic characterization of Fresnel lenses | |
| dc.type | book part | |
| dc.volume.number | 8169 | |
| dspace.entity.type | Publication | |
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