Electron beam-induced current imaging of chemical vapor-deposited diamond films
dc.contributor.author | Cremades Rodríguez, Ana Isabel | |
dc.contributor.author | Piqueras De Noriega, Francisco Javier | |
dc.contributor.author | Schreck, M. | |
dc.date.accessioned | 2023-06-20T18:53:01Z | |
dc.date.available | 2023-06-20T18:53:01Z | |
dc.date.issued | 1997-01 | |
dc.description | © 1997 Elsevier Science S.A. This work has been partially supported by DGICYT {Project PB93-1256). A.C. thanks the Universidad Complutense for a pre-doctoral grant. The authors thank Dr. R. Hessmer for growing the samples. | |
dc.description.abstract | Electron beam-induced current (EBIC) is applied to the characterization of chemical vapor-deposited (CVD) diamond films. EBIC contrast shows a strong dependence on the orientation of grains relative to the incident electron beam. This is due to the correspondence between certain faces of the diamond grains and enhanced recombination. Cathodoluminescence (CL) images enable identification of the (100) faces of the epitaxial layers as preferential radiative recombination sites, in agreement with the EBIC contrast shown by these films. The capability of the EBIC technique to study recombination processes with high spatial resolution as compared to CL, is analyzed in this work. | |
dc.description.department | Depto. de Física de Materiales | |
dc.description.faculty | Fac. de Ciencias Físicas | |
dc.description.refereed | TRUE | |
dc.description.sponsorship | DGICYT (Spain) | |
dc.description.sponsorship | Universidad Complutense | |
dc.description.status | pub | |
dc.eprint.id | https://eprints.ucm.es/id/eprint/23592 | |
dc.identifier.doi | 10.1016/S0925-9635(96)00595-X | |
dc.identifier.issn | 0925-9635 | |
dc.identifier.officialurl | http://www.sciencedirect.com/science/article/pii/S092596359600595X | |
dc.identifier.relatedurl | http://www.sciencedirect.com | |
dc.identifier.uri | https://hdl.handle.net/20.500.14352/58851 | |
dc.issue.number | 1 | |
dc.journal.title | Diamond and Related Materials | |
dc.language.iso | eng | |
dc.page.final | 98 | |
dc.page.initial | 95 | |
dc.publisher | Elsevier Science SA | |
dc.relation.projectID | PB93-1256 | |
dc.rights.accessRights | restricted access | |
dc.subject.cdu | 538.9 | |
dc.subject.keyword | Cathodoluminescence | |
dc.subject.keyword | Defects | |
dc.subject.keyword | Luminescence | |
dc.subject.keyword | Impurities | |
dc.subject.ucm | Física de materiales | |
dc.title | Electron beam-induced current imaging of chemical vapor-deposited diamond films | |
dc.type | journal article | |
dc.volume.number | 6 | |
dcterms.references | 1. L.H. Robins, L. P. Cook, E. N. Farabaugh and A. Feldman, Phys. Rev., B 39 (1089) 13367. 2. B.G. Yacobi, A. R. Badzian and Badzian; j. aPPL.pHYS., 69 (1991) 1643. 3. R. J. Graham, T. D. Moustakas and M.M. Disko, J. Appl. Phys., 69 (1991) 3212. 4. Graham and K. V. Ravi Appl. Phys., Lett., 60 (1992) 1310. 5. A. Cremades, F. Dominguez-Adame and J. Piqueras , J. Appl. Phys., 74 (1993) 5726. 6. A. Cremades and J. Piqueras, J. Appl., 78 (1995) 3353. 7. R. Heiderhoff, P. Koschinski, M Maywald, L. J. Balk and P. K. Bachnmann, Diamond Relat. Mater., 4 (1995) 645. 8. M. Schreek, R. Hessmer, S. Geier, B. Rauschenbach and B. Strizker, DoamondRelat. Mater., 3 (1994) 510. 9. R. Hessmer, M. Schreck, S. Geier and B. Strizker, Diamond Relat. Mater., 3 (1994) 951. 10. T. Tachibana, D. E. williams and J. T. Glass, Phys. Rev. B45 ( 1992) 11975. 11. H. Kawarada, K. Nishimura, T. Ito, J. Suzuki, K.S. Mar, Y. Yokota and A. Hiraki, pn. J. Appl. Phys Lett., 27 (1988) 6836. 12. A. T. Collins, Diamond. Relat Mater., 1 (1992) 457. | |
dspace.entity.type | Publication | |
relation.isAuthorOfPublication | da0d631e-edbf-434e-8bfd-d31fb2921840 | |
relation.isAuthorOfPublication | 68dabfe9-5aec-4207-bf8a-0851f2e37e2c | |
relation.isAuthorOfPublication.latestForDiscovery | da0d631e-edbf-434e-8bfd-d31fb2921840 |
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