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Electron beam-induced current imaging of chemical vapor-deposited diamond films

dc.contributor.authorCremades Rodríguez, Ana Isabel
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorSchreck, M.
dc.date.accessioned2023-06-20T18:53:01Z
dc.date.available2023-06-20T18:53:01Z
dc.date.issued1997-01
dc.description© 1997 Elsevier Science S.A. This work has been partially supported by DGICYT {Project PB93-1256). A.C. thanks the Universidad Complutense for a pre-doctoral grant. The authors thank Dr. R. Hessmer for growing the samples.
dc.description.abstractElectron beam-induced current (EBIC) is applied to the characterization of chemical vapor-deposited (CVD) diamond films. EBIC contrast shows a strong dependence on the orientation of grains relative to the incident electron beam. This is due to the correspondence between certain faces of the diamond grains and enhanced recombination. Cathodoluminescence (CL) images enable identification of the (100) faces of the epitaxial layers as preferential radiative recombination sites, in agreement with the EBIC contrast shown by these films. The capability of the EBIC technique to study recombination processes with high spatial resolution as compared to CL, is analyzed in this work.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipDGICYT (Spain)
dc.description.sponsorshipUniversidad Complutense
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/23592
dc.identifier.doi10.1016/S0925-9635(96)00595-X
dc.identifier.issn0925-9635
dc.identifier.officialurlhttp://www.sciencedirect.com/science/article/pii/S092596359600595X
dc.identifier.relatedurlhttp://www.sciencedirect.com
dc.identifier.urihttps://hdl.handle.net/20.500.14352/58851
dc.issue.number1
dc.journal.titleDiamond and Related Materials
dc.language.isoeng
dc.page.final98
dc.page.initial95
dc.publisherElsevier Science SA
dc.relation.projectIDPB93-1256
dc.rights.accessRightsrestricted access
dc.subject.cdu538.9
dc.subject.keywordCathodoluminescence
dc.subject.keywordDefects
dc.subject.keywordLuminescence
dc.subject.keywordImpurities
dc.subject.ucmFísica de materiales
dc.titleElectron beam-induced current imaging of chemical vapor-deposited diamond films
dc.typejournal article
dc.volume.number6
dcterms.references1. L.H. Robins, L. P. Cook, E. N. Farabaugh and A. Feldman, Phys. Rev., B 39 (1089) 13367. 2. B.G. Yacobi, A. R. Badzian and Badzian; j. aPPL.pHYS., 69 (1991) 1643. 3. R. J. Graham, T. D. Moustakas and M.M. Disko, J. Appl. Phys., 69 (1991) 3212. 4. Graham and K. V. Ravi Appl. Phys., Lett., 60 (1992) 1310. 5. A. Cremades, F. Dominguez-Adame and J. Piqueras , J. Appl. Phys., 74 (1993) 5726. 6. A. Cremades and J. Piqueras, J. Appl., 78 (1995) 3353. 7. R. Heiderhoff, P. Koschinski, M Maywald, L. J. Balk and P. K. Bachnmann, Diamond Relat. Mater., 4 (1995) 645. 8. M. Schreek, R. Hessmer, S. Geier, B. Rauschenbach and B. Strizker, DoamondRelat. Mater., 3 (1994) 510. 9. R. Hessmer, M. Schreck, S. Geier and B. Strizker, Diamond Relat. Mater., 3 (1994) 951. 10. T. Tachibana, D. E. williams and J. T. Glass, Phys. Rev. B45 ( 1992) 11975. 11. H. Kawarada, K. Nishimura, T. Ito, J. Suzuki, K.S. Mar, Y. Yokota and A. Hiraki, pn. J. Appl. Phys Lett., 27 (1988) 6836. 12. A. T. Collins, Diamond. Relat Mater., 1 (1992) 457.
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relation.isAuthorOfPublication.latestForDiscoveryda0d631e-edbf-434e-8bfd-d31fb2921840

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