Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests
| dc.contributor.author | Franco Peláez, Francisco Javier | |
| dc.contributor.author | Clemente Barreira, Juan Antonio | |
| dc.contributor.author | Korkian, Golnaz | |
| dc.contributor.author | Fabero Jiménez, Juan Carlos | |
| dc.contributor.author | Mecha López, Hortensia | |
| dc.contributor.author | Velazco, Raoul | |
| dc.date.accessioned | 2023-06-16T15:16:14Z | |
| dc.date.available | 2023-06-16T15:16:14Z | |
| dc.date.issued | 2020 | |
| dc.description.abstract | In radiation tests on SRAMs or FPGAs, two or more independent bitflips can be misled with a multiple event if they accidentally occur in neighbor cells. In the past, different tests such as the ``birthday statistics'' have been proposed to estimate the accuracy of the experimental results. In this paper, simple formulae are proposed to determine the expected number of false 2-bit and 3-bit MCUs from the number of bitflips, memory size and the method used to search multiple events. These expressions are validated using Monte Carlo simulations and experimental data. Also, a technique is proposed to refine experimental data and thus partially removing possible false events. Finally, it is demonstrated that there is a physical limit to determine the cross section of memories with arbitrary accuracy from a single experiment. | |
| dc.description.department | Depto. de Estructura de la Materia, Física Térmica y Electrónica | |
| dc.description.department | Depto. de Arquitectura de Computadores y Automática | |
| dc.description.faculty | Fac. de Ciencias Físicas | |
| dc.description.faculty | Fac. de Informática | |
| dc.description.refereed | TRUE | |
| dc.description.sponsorship | Ministerio de Economía y Competitividad (MINECO) | |
| dc.description.status | inpress | |
| dc.eprint.id | https://eprints.ucm.es/id/eprint/59495 | |
| dc.identifier.doi | 10.1109/TNS.2020.2977698 | |
| dc.identifier.issn | 0018-9499 | |
| dc.identifier.officialurl | https://ieeexplore.ieee.org/document/9020111 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14352/6087 | |
| dc.journal.title | IEEE Transactions on Nuclear Science | |
| dc.language.iso | eng | |
| dc.publisher | IEEE-Inst Electrical Electronics Engineers Inc | |
| dc.relation.projectID | (FPA2017-82729-C6-4-R and TIN2017-87237) | |
| dc.rights | Atribución-CompartirIgual 3.0 España | |
| dc.rights.accessRights | open access | |
| dc.rights.uri | https://creativecommons.org/licenses/by-sa/3.0/es/ | |
| dc.subject.keyword | Birtdhay Statistics | |
| dc.subject.keyword | FPGA | |
| dc.subject.keyword | SEU | |
| dc.subject.keyword | SRAM | |
| dc.subject.ucm | Electrónica (Física) | |
| dc.subject.ucm | Radiactividad | |
| dc.subject.ucm | Circuitos integrados | |
| dc.subject.ucm | Electrónica (Informática) | |
| dc.subject.ucm | Electrónica (Informática) | |
| dc.subject.unesco | 2203.07 Circuitos Integrados | |
| dc.subject.unesco | 2203 Electrónica | |
| dc.subject.unesco | 2203 Electrónica | |
| dc.title | Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests | |
| dc.type | journal article | |
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