Variogram-based method for contrast measurement

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dc.contributor.authorSánchez Brea, Luis Miguel
dc.contributor.authorTorcal Milla, Francisco José
dc.contributor.authorBernabeu Martínez, Eusebio
dc.date.accessioned2023-06-20T10:45:59Z
dc.date.available2023-06-20T10:45:59Z
dc.date.issued2007-08-01
dc.description© 2007 Optical Society of America. The authors thank Tomás Morlanes for his valuable ideas. This work has been supported by the “Codificación óptica de la posición a escala nanométrica: Nuevas tecnologías y dispositivos ópticos” project (DPI2005-02860) of the Ministerio de Educación y Ciencia of Spain and the “Tecnologías en ecología, alta precisión y productividad, multifuncionalidad, y tecnologías de la información y comunicaciones en Máquina Herramienta” CENIT project of the Ministerio de Industria, turismo y comercio. Sanchez-Brea is currently contracted by the Universidad Complutense de Madrid under the “Ramón y Cajal” research program of the Ministerio de Educación y Ciencia of Spain.
dc.description.abstractWe present a technique for determining the contrast of an intensity distribution in the presence of additive noise and other effects, such as undesired local amplitude or offset variations. The method is based on the variogram function. It just requires the measurement of the variogram at only four points and, as a consequence, it is very fast. The proposed technique is compared with other standard techniques, showing a reduction in the error of the contrast measurement.
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Educación y Ciencia (MEC), España
dc.description.sponsorshipMinisterio de Industria, Turismo y Comercio, España
dc.description.sponsorshipUniversidad Complutense de Madrid (UCM)
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26658
dc.identifier.citation1. G. C. Holst, CCD Arrays, Cameras, and Displays (Society for Photo-Optical Instrumentation Engineers, 1996). 2. P. Hariharan, Optical Interferometry (Academic, 1989). 3. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, 1996). 4. W. K. Pratt, Digital Image Processing (Wiley, 1978). 5. International Standardization Organization, Guide to the Expression of the Uncertainty in Measurement, Geneva (ISO, 1995). 6. E. W. Weisstein, "Root-mean-square," From MathWorld--A Wolfram Web Resource. http://mathworld.wolfram.com/Root-Mean-Square.html. 7. S. Lai and G. Von Bally, "Fringe contrast evaluation by means of histograms," in OPTIKA '98: 5th Congress on Modern Optics, G. Ákos, G. Lupkovics, and P. András, eds. Proc. SPIE 3573, 384-387 (1998). 8. L. M. Sánchez-Brea, J. A. Quiroga, A. García-Botella, and E. Bernabéu, "Histogram-based method for contrast measurement," Appl. Opt. 39, 4098-4106 (2000). 9. R. Christiensen, Linear Models for Multivariate, Time Series, and Spatial Data (Springer-Verlag, 1985). 10. N. A. Cressie, Statistics for Spatial Data (Wiley, 1991). 11. L. M. Sánchez-Brea and E. Bernabéu, "On the standard deviation in CCD cameras: a variogram-based technique for non-uniform images," J. Electron. Imaging 11, 121-126 (2002). 12. L. M. Sánchez-Brea and E. Bernabéu, "Estimation of the standard deviation in three-dimensional microscopy by spatial statistics," J. Microsc. 218, 193-197 (2005). 13. P. Bevington, Data Reduction and Error Analysis for the Physical Sciences (McGraw-Hill, 1969). 14. E. Keren and O. Kafri, "Diffraction effects in moire deflectometry," J. Opt. Soc. Am. A 2, 111-120 (1985).
dc.identifier.doi10.1364/AO.46.005027
dc.identifier.issn1559-128X
dc.identifier.officialurlhttp://dx.doi.org/10.1364/AO.46.005027
dc.identifier.relatedurlhttp://www.opticsinfobase.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/51179
dc.issue.number22
dc.journal.titleApplied Optics
dc.language.isoeng
dc.page.initial5027
dc.publisherThe Optical Society Of America
dc.relation.projectIDDPI2005-02860
dc.relation.projectIDCENIT
dc.relation.projectID“Ramón y Cajal”
dc.rights.accessRightsopen access
dc.subject.cdu535
dc.subject.keywordStandard-Deviation
dc.subject.ucmÓptica (Física)
dc.subject.unesco2209.19 Óptica Física
dc.titleVariogram-based method for contrast measurement
dc.typejournal article
dc.volume.number46
dspace.entity.typePublication
relation.isAuthorOfPublication72f8db7f-8a25-4d15-9162-486b0f884481
relation.isAuthorOfPublication.latestForDiscovery72f8db7f-8a25-4d15-9162-486b0f884481
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