Electrical conductivity relaxation in thin-film yttria-stabilized zirconia
dc.contributor.author | Rivera Calzada, Alberto Carlos | |
dc.contributor.author | Santamaría Sánchez-Barriga, Jacobo | |
dc.contributor.author | León Yebra, Carlos | |
dc.date.accessioned | 2023-06-20T20:08:03Z | |
dc.date.available | 2023-06-20T20:08:03Z | |
dc.date.issued | 2001-01-29 | |
dc.description | © 2001 American Institute of Physics. | |
dc.description.abstract | We report on complex admittance measurements on ZrO_(2):Y_(2)O_(3) (YSZ) thin films in the parallel plate geometry. Highly textured YSZ thin films, grown by rf sputtering, allow measuring complex admittance free of the effect of charge blocking at grain boundaries. We have examined low-temperature (close to room temperature) regime dominated by association of oxygen vacancies. Complex admittance analyzed in terms of the modulus formalism supplies information on correlation effects in ion motion and allows obtaining an association energy for the oxygen vacancies of 0.45 eV, in agreement with previous theoretical calculations. | |
dc.description.department | Depto. de Estructura de la Materia, Física Térmica y Electrónica | |
dc.description.faculty | Fac. de Ciencias Físicas | |
dc.description.refereed | TRUE | |
dc.description.status | pub | |
dc.eprint.id | https://eprints.ucm.es/id/eprint/31158 | |
dc.identifier.doi | 10.1063/1.1343852 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.officialurl | http://dx.doi.org/10.1063/1.1343852 | |
dc.identifier.relatedurl | http://scitation.aip.org/ | |
dc.identifier.uri | https://hdl.handle.net/20.500.14352/59643 | |
dc.issue.number | 5 | |
dc.journal.title | Applied physics letters | |
dc.language.iso | eng | |
dc.page.final | 612 | |
dc.page.initial | 610 | |
dc.publisher | American Institute of Physics | |
dc.rights.accessRights | open access | |
dc.subject.cdu | 537 | |
dc.subject.keyword | Ionic-conductivity | |
dc.subject.keyword | Glasses | |
dc.subject.keyword | Crystals | |
dc.subject.keyword | Dynamics. | |
dc.subject.ucm | Electricidad | |
dc.subject.ucm | Electrónica (Física) | |
dc.subject.unesco | 2202.03 Electricidad | |
dc.title | Electrical conductivity relaxation in thin-film yttria-stabilized zirconia | |
dc.type | journal article | |
dc.volume.number | 78 | |
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dspace.entity.type | Publication | |
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relation.isAuthorOfPublication.latestForDiscovery | 65d45b0a-357f-4ec4-9f97-0ffd3e1cbdcc |
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