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Complete characterization of arbitrary quantum measurement processes

dc.contributor.authorLuis Aina, Alfredo
dc.contributor.authorSánchez Soto, Luis Lorenzo
dc.date.accessioned2023-06-20T20:09:03Z
dc.date.available2023-06-20T20:09:03Z
dc.date.issued1999-11-01
dc.description© 1999 The American Physical Society
dc.description.abstractWe examine two simple and feasible practical schemes allowing the complete determination of any quantum measuring arrangement. This is illustrated with the example of parity measurement.
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/32455
dc.identifier.doi10.1103/PhysRevLett.83.3573
dc.identifier.issn0031-9007
dc.identifier.officialurlhttp://dx.doi.org/10.1103/PhysRevLett.83.3573
dc.identifier.relatedurlhttp://journals.aps.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59685
dc.issue.number18
dc.journal.titlePhysical review letters
dc.language.isoeng
dc.page.final3576
dc.page.initial3573
dc.publisherAmerican Physical Society
dc.rights.accessRightsopen access
dc.subject.cdu535
dc.subject.keywordSqueezed states
dc.subject.keywordDensity-matrix
dc.subject.keywordReconstruction
dc.subject.keywordLight
dc.subject.ucmÓptica (Física)
dc.subject.unesco2209.19 Óptica Física
dc.titleComplete characterization of arbitrary quantum measurement processes
dc.typejournal article
dc.volume.number83
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relation.isAuthorOfPublication.latestForDiscoveryb6f1fe2b-ee48-4add-bb0d-ffcbfad10da2

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