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Evaluating the SEE sensitivity of a 45nm SOI Multi-core Processor due to 14 MeV Neutrons

dc.contributor.authorClemente Barreira, Juan Antonio
dc.contributor.authorRamos, Pablo
dc.contributor.authorVargas Vallejo, Vanessa Carolina
dc.contributor.authorBaylac, Maud
dc.contributor.authorVilla, Francesca
dc.contributor.authorRey, Solenne
dc.contributor.authorZergainoh, Nacer-Eddine
dc.contributor.authorMéhaut, Jean-François
dc.date.accessioned2023-06-17T23:52:58Z
dc.date.available2023-06-17T23:52:58Z
dc.date.copyright© © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en
dc.date.issued2016-08
dc.description.abstractThe aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implemented ECC and parity in their cache memories. Two different application scenarios are studied. The first one configures the multi-core in Asymmetric Multi-Processing mode running a memory-bound application, whereas the second one uses the Symmetric Multi-Processsing mode running a CPU-bound application. The experiments were validated through radiation ground testing performed with 14 MeV neutrons on the Freescale P2041 multi-core manufactured in 45nm SOI technology. A deep analysis of the observed errors in cache memories was carried-out in order to reveal vulnerabilities in the cache protection mechanisms. Critical zones like tag addresses were affected during the experiments. In addition, the results show that the sensitivity strongly depends on the application and the multi-processsing mode used.en
dc.description.departmentDepto. de Arquitectura de Computadores y Automática
dc.description.facultyFac. de Informática
dc.description.refereedTRUE
dc.description.sponsorshipe2v
dc.description.sponsorshipSecretaría de Educación Superior, Ciencia, Tecnología e Innovación (Ecuador)
dc.description.sponsorshipMinisterio de Educación, Cultura y Deportes (España)
dc.description.sponsorship Ministerio de Ciencia, Innovación y Universidades (España)
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/39049
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dc.identifier.doi10.1109/TNS.2016.2537643
dc.identifier.issn0018-9499
dc.identifier.officialurlhttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7509641
dc.identifier.urihttps://hdl.handle.net/20.500.14352/18960
dc.issue.number4
dc.journal.titleIEEE Transactions on Nuclear Science
dc.language.isospa
dc.page.final2200
dc.page.initial2193
dc.publisherNuclear & Plasma Sciences Society
dc.relation.projectIDTIN2013-40968-P
dc.relation.projectIDBeca de movilidad "José Castillejo para jóvenes doctores"
dc.rights.accessRightsopen access
dc.subject.cdu004.31
dc.subject.keywordAccelerated testing
dc.subject.keywordAMP
dc.subject.keywordMulti-core
dc.subject.keywordSEE
dc.subject.keywordSEFI
dc.subject.keywordSEU
dc.subject.keywordSoft Error
dc.subject.keywordSOI
dc.subject.keywordSMP
dc.subject.keywordFísica nuclear
dc.subject.keywordRadiactividad
dc.subject.keywordCircuitos integrados
dc.subject.ucmHardware
dc.subject.ucmElectrónica (Física)
dc.subject.unesco2207 Física Atómica y Nuclea
dc.subject.unesco2203.07 Circuitos Integrados
dc.titleEvaluating the SEE sensitivity of a 45nm SOI Multi-core Processor due to 14 MeV Neutronsen
dc.typejournal article
dc.volume.number63
dspace.entity.typePublication
relation.isAuthorOfPublication919b239d-a500-4adb-aacf-00206a2c1512
relation.isAuthorOfPublication.latestForDiscovery919b239d-a500-4adb-aacf-00206a2c1512

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