Improved regularised phase-tracking technique for the processing of squared-grating deflectograms

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dc.contributor.authorQuiroga Mellado, Juan Antonio
dc.contributor.authorVilla Hernández, José de Jesús
dc.contributor.authorServín Guirado, Manuel
dc.date.accessioned2023-06-20T18:51:29Z
dc.date.available2023-06-20T18:51:29Z
dc.date.issued2000-02-01
dc.description© 2000 Optical Society of America. We acknowledge the support of a postdoctoral grant from the Universidad Complutense de Madrid, the “Becas Internacionales Flores-Valles” program, Spain, and the Consejo Nacional de Ciencia y Tecnología (CONACyT), México.
dc.description.abstractWe propose a robust procedure based on the regularized phase-tracking (RPT) technique to demodulate squared-grating deflectograms. The use of squared gratings, already reported, lets us multiplex the information of the deflections in two orthogonal directions in a single image, thus avoiding the necessity of rotating the gratings. The good noise-rejection characteristics of the RPT technique are improved by use of a quasi-Newton optimization algorithm and a quality-map-based algorithm for the crystal-growing process.
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipBecas Internacionales Flores-Valles program, Spain
dc.description.sponsorshipUniversidad Complutense de Madrid
dc.description.sponsorshipConsejo Nacional de Ciencia y Tecnología (CONACyT), México
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/23211
dc.identifier.citation1. A. W. Lohmann and D. E. Silva, “An interferometer based on talbot effect”, Opt. Commun. 2, 413–415 (1971). 2. O. Kafri and I. Glatt, The Physics of Moiré Metrology (Wiley, New York, 1989). 3. O. Kafri and A Livnat, “Reflective surface analysis using moiré deflectometry”, Appl. Opt. 26, 2507–2508 (1987). 4. Z. Karny and O. Kafri, “Refractive-index measurement by moiré deflectometry”, Appl. Opt. 21, 3326–3328 (1982). 5. E. Keren and E. Bar-Ziv, “Measurements of temperature distribution flames by moiré deflectometry”, Appl. Opt. 20, 4263–4266 (1981). 6. M. Servín and R Rodríguez-Vera, “Automatic fringe detection algorithm used for moiré deflectometry”, Appl. Opt. 29, 3266–3270 (1990). 7. H. Canabal and J. A. Quiroga, “Automatic processing in moiré deflectometry by local fringe direction calculation”, Appl. Opt. 37, 5894–5901 (1998). 8. T. Pfeifer and B. Wang, “Phase-shifting moiré deflectometry”, Optik 98, 158–162 (1995). 9. H. Canabal, J. A. Quiroga, and E. Bernabeu, “Improved phaseshifting method for automatic processing of moiré deflectograms”, Appl. Opt. 37, 6227–6233 (1998). 10. E. Keren and O. Kafri, “Diffraction effects in moiré deflectometry”, J. Opt. Soc. Am. A 2, 111–120 (1985). 11. E. Bar-Ziv, “Effect of diffraction on the moiré image”, J. Opt. Soc. Am. A 2, 371–379 (1985). 12. M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer based topography and interferometry”, J. Opt. Soc. Am. A 72, 156–160 (1982). 13. M. Takeda and S. Kobayashi, “Lateral aberration measurements with a digital Talbot interferometer”, Appl. Opt. 23, 1760–1764 (1984). 14. J. A. Quiroga, D. Crespo, and E. Bernabeu, “Fourier transform method for automatic processing of moiré deflectograms”, Opt. Eng. 38, 974–982 (1999). 15. C. Roddier and F. Roddier, “Interferogram analysis using Fourier transform techniques”, Appl. Opt. 26, 1668–1673 (1987). 16. J. Gu and F. Chen, “Fast Fourier transform, iteration, and least-squares-fit demodulation image processing of single carrier fringe pattern”, J. Opt. Soc. Am. A 12, 2159–2164 (1995). 17. M. Servín, J. L. Marroquín, and F. J. Cuevas, “Demodulation of a single interferogram by use of a two dimensional regularized phase-tracking technique”, Appl. Opt. 36, 4540–4548 (1997). 18. J. C. Wyant, “Double frequency grating lateral shear interferometer”, Appl. Opt. 12, 2057–2060 (1973). 19. J. M. Huntley and J. E. Field, “High resolution moiré photography: application to dynamic stress analysis”, Opt. Eng. 28, 926–933 (1989). 20. M. Bertero and P. Boccacci, Introduction to Inverse Problems in Imaging (Institute of Physics, London,1998), Chap. 5. 21. Matlab Optimization Toolbox, User’s Guide, Version 5 (Math-Works Inc., 24 Prime Park Way, Natick, Mass., 01760–1500). 22. B. Ströbel, “Processing of interferometric phase maps as complex-valued phasor images”, Appl. Opt. 35, 2192–2198 (1996). 23. R. L. Burden and J. D. Faires, Numerical Analysis, 6th ed. (International Thomson Publishing, Stamford, Conn., 1997). 24. J. Alonso, J. A. Gómez-Pedrero, and E. Bernabeu, “Local dioptric power matrix in a progressive addition lens”, Ophthalmic Physiol. Opt. 17, 522–529 (1997).
dc.identifier.doi10.1364/AO.39.000502
dc.identifier.issn0003-6935
dc.identifier.officialurlhttp://dx.doi.org/10.1364/AO.39.000502
dc.identifier.relatedurlhttp://www.opticsinfobase.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/58791
dc.issue.number4
dc.journal.titleApplied Optics
dc.language.isoeng
dc.page.final508
dc.page.initial502
dc.publisherThe Optical Society of America
dc.rights.accessRightsopen access
dc.subject.cdu535
dc.subject.keywordMoire Deflectometry
dc.subject.keywordFourier-Transform
dc.subject.keywordFringe-Pattern
dc.subject.keywordInterferometer
dc.subject.keywordDemodulation
dc.subject.keywordDiffraction
dc.subject.keywordImage
dc.subject.ucmÓptica (Física)
dc.subject.unesco2209.19 Óptica Física
dc.titleImproved regularised phase-tracking technique for the processing of squared-grating deflectograms
dc.typejournal article
dc.volume.number39
dspace.entity.typePublication
relation.isAuthorOfPublication1c171089-8e25-448f-bcce-28d030f8f43a
relation.isAuthorOfPublication.latestForDiscovery1c171089-8e25-448f-bcce-28d030f8f43a
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