Aviso: para depositar documentos, por favor, inicia sesión e identifícate con tu cuenta de correo institucional de la UCM con el botón MI CUENTA UCM. No emplees la opción AUTENTICACIÓN CON CONTRASEÑA
 

Study of the defects in sintered SnO_2 by high-resolution transmission electron microscopy and cathodoluminescence

dc.contributor.authorMaestre Varea, David
dc.contributor.authorRamírez Castellanos, Julio
dc.contributor.authorHidalgo Alcalde, Pedro
dc.contributor.authorCremades Rodríguez, Ana Isabel
dc.contributor.authorGonzález Calbet, José María
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.date.accessioned2023-06-20T10:37:38Z
dc.date.available2023-06-20T10:37:38Z
dc.date.issued2007-04
dc.description© Wiley-VCH Verlag GmbH & Co. KGaA, 69451 Weinheim, Germany, 2007. This work was supported by MEC (project MAT 2003-00455) and by UCM-CM (Group 910146).
dc.description.abstractThe defect structure of sintered SnO_2 was investigated by high-resolution transmission electron microscopy (HRTEM), cathodoluminescence (CL), and electrical measurements. HRTEM shows the presence of the SnO phase in the sintered samples as well as twinning, stacking faults, and disordered intergrowths. The sintered samples annealed under an oxygen atmosphere show changes in the defect structure and in the CL spectra. In particular, the intensity of a CL band at 1.94 eV, related to oxygen vacancies, decreased as the electrical resistivity increased. The results are discussed by considering the presence of stoichiometric defects such as oxygen vacancies and Sn interstitials in the final structure and their evolution during the annealing process under an oxygen atmosphere.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipMEC
dc.description.sponsorshipUCM-CM
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/23099
dc.identifier.doi10.1002/ejic.200600990
dc.identifier.issn1434-1948
dc.identifier.officialurlhttp://onlinelibrary.wiley.com/doi/10.1002/ejic.200600990/full
dc.identifier.relatedurlhttp://onlinelibrary.wiley.com
dc.identifier.urihttps://hdl.handle.net/20.500.14352/50820
dc.issue.number11
dc.journal.titleEuropean Journal of Inorganic Chemistry
dc.language.isoeng
dc.page.final1548
dc.page.initial1544
dc.publisherWiley-V C H Verlag GmbH
dc.relation.projectIDMAT 2003-00455
dc.relation.projectIDGroup 910146
dc.rights.accessRightsrestricted access
dc.subject.cdu538.9
dc.subject.keywordTransparent Conducting Oxide
dc.subject.keywordThin-Films
dc.subject.keywordTin Dioxide
dc.subject.keywordOxygen
dc.subject.keywordInterfaces
dc.subject.keywordSurface
dc.subject.keywordStates
dc.subject.ucmFísica de materiales
dc.titleStudy of the defects in sintered SnO_2 by high-resolution transmission electron microscopy and cathodoluminescence
dc.typejournal article
dcterms.references[1] B. Drevillon, S. Kumer, P. R. Carbarrocas, J. M. Siefert, J. Appl. Phys. Lett. 1989, 54, 2088. [2] G. Martinelli, M. C. Carotta, E. Traversa, G. Ghiotti, MRS Bull. 1999, 24, 30. [3] A. Lousa, S. Gimeno, J. Marti, Vacuum 1994, 45, 1143. [4] D. F. Cox, T. B. Fryberger, S. Semacik, Phys. Rev. B 1988, 38, 2072. [5] C. Kiliç, A. Zunger, Phys. Rev. Lett. 2002, 88, 095501. [6] D. Maestre, A. Cremades, J. Piqueras, J. Appl. Phys. 2003, 95, 3027. [7] D. Maestre, A. Cremades, J. Piqueras, Semicond. Sci. Technol. 2004, 19, 1236. [8] J. G. Zheng, X. Pen, M. Scheweizer, F. Zhou, U. Weimar, W. Gopel, M. Ruhle, J. Appl. Phys. 1996, 79, 7688. [9] J. Y. Huang, B. H. Park, D. Jan, X. Q. Pan, Y. T. Zhu, Q. X. Jia, Philos. Magn. A 2002, 82, 735. [10] S. Samson, C. G. Fonstad, J. Appl. Phys. 1973, 44, 4618. [11] J. M. Themlin, R. Sporken, J. Darville, R. Caudano, J. M. Gilles, R. L. Johnson, Phys. Rev. B 1990, 42, 11914. [12] B. Kamp, R. Merkle, J. Maier, Sens. Actuators, B 2001, 77, 534. [13] U. Pulkkinen, T. T. Rantala, T. S. Rantala, V. Lantto, J. Mol. Catal. A 2001, 166, 15. [14] C. Terrier, J. P. Chatelon, R. Berjoan, J. A. Roger, Thin Solid Films 1995, 263, 37. [15] M. K. Paria, H. S. Maiti, J. Mater. Sci. 1983, 18, 2101. [16] B. Sterjna, C. G. Granqviest, A. Seidel, L. Häggström, J. Appl. Phys. 1990, 68, 6241. [17] Z. W. Chen, J. K. L. Lai, C. H. Shek, J. Solid State Chem. 2005, 178, 892. [18] S. Cahen, N. David, J. M. Fiorani, A. Maitre, M. Vilasi, Thermochim. Acta 2003, 403, 275.
dspace.entity.typePublication
relation.isAuthorOfPublication43cbf291-2f80-4902-8837-ea2a9ffaa702
relation.isAuthorOfPublicationa5228dab-0ca7-4ad9-b1a2-be7c2d951695
relation.isAuthorOfPublicationc834e5a4-3450-4ff7-8ca1-663a43f050bb
relation.isAuthorOfPublicationda0d631e-edbf-434e-8bfd-d31fb2921840
relation.isAuthorOfPublication46a55ceb-7c67-4916-acc8-f9b9c7a5bd38
relation.isAuthorOfPublication68dabfe9-5aec-4207-bf8a-0851f2e37e2c
relation.isAuthorOfPublication.latestForDiscovery43cbf291-2f80-4902-8837-ea2a9ffaa702

Download

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
CremadesAna18.pdf
Size:
134.07 KB
Format:
Adobe Portable Document Format

Collections