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Scanning tunneling spectroscopy study of silicon and platinum assemblies in an opal matrix

dc.contributor.authorDíaz-Guerra Viejo, Carlos
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorGolubev, VG.
dc.contributor.authorKurdyukov, D.A.
dc.contributor.authorPevtsov, A. B.
dc.contributor.authorZamoryanskaya, M. V.
dc.date.accessioned2023-06-20T19:01:45Z
dc.date.available2023-06-20T19:01:45Z
dc.date.issued2002-11-13
dc.description© 2000 American Institute of Physics. This work was supported by DGES (Project No. PB96-0639), the Russian R&D program ‘‘Nanostructures’’ (Grant No. 97-2016) and RFBR under Grant No. 98-02-17350.
dc.description.abstractScanning tunneling microscopy and scanning tunneling spectroscopy (STS) are used to investigate the local electronic behavior of Pt-Si nanostructures fabricated in an opal matrix formed by silica spheres of 250 nm diameter. Si and Pt are regularly distributed inside the opal pores and form nanoscale metal-semiconductor-metal junctions. Normalized differential conductance curves enable us to study the distribution of Pt and Si and to detect the presence of regions showing a surface band gap in the range 0.5-0.8 eV, possibly associated with the formation of silicides. STS appears as a suitable technique for the electrical characterization of opal-based nanostructures.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipDGES
dc.description.sponsorshipRussian R&D program ‘‘Nanostructures’’
dc.description.sponsorshipRFBR
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26341
dc.identifier.doi10.1063/1.1325387
dc.identifier.issn0003-6951
dc.identifier.officialurlhttp://dx.doi.org/10.1063/1.1325387
dc.identifier.relatedurlhttp://scitation.aip.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59132
dc.issue.number20
dc.journal.titleApplied Physics Letters
dc.language.isoeng
dc.page.final3196
dc.page.initial3194
dc.publisherAmer Inst Physics
dc.relation.projectIDPB96- 0639
dc.relation.projectID97-2016
dc.relation.projectID98-02-17350
dc.rights.accessRightsopen access
dc.subject.cdu538.9
dc.subject.keywordElectronic-Structure
dc.subject.keywordSi(111)2x1 Surface
dc.subject.keywordMicroscopy
dc.subject.ucmFísica de materiales
dc.titleScanning tunneling spectroscopy study of silicon and platinum assemblies in an opal matrix
dc.typejournal article
dc.volume.number77
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relation.isAuthorOfPublication.latestForDiscoveryb1b44979-3a0d-45d7-aa26-a64b0dbfee18

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