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Deformation-induced defect levels in ZeSe crystals

dc.contributor.authorFernández Sánchez, Paloma
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorUrbieta Quiroga, Ana Irene
dc.contributor.authorRebane, Y. T.
dc.contributor.authorShrete, Y.
dc.date.accessioned2023-06-20T19:01:55Z
dc.date.available2023-06-20T19:01:55Z
dc.date.issued1999-05
dc.description© 1999 IOP Publishing Ltd. This work has been supported by DGES (Project PB96-0639). The Russian Fund for Fundamental Studies (Projects 98-01-01084 and 96-01-196825) is also acknowledged.
dc.description.abstractThe influence of defects, in particular the deformation-induced defects, on the luminescence of bulk ZnSe single crystals has been investigated by cathodoluminescence (CL) in the scanning electron microscope. Deformation has been found to cause a reduction of the total CL intensity of the sample. CL images of deformed samples reveal dark slip bands. The CL spectrum of an undeformed crystal shows the near-band-edge emission at 2.8 eV and a broad band peaked at 2.2 eV with a shoulder at about 2 eV. Deformation at low strain causes only slight spectral changes while in a heavily deformed crystal a strong relative enhancement of the deep level band in the range 2-2.2 eV is observed. The relation of these spectral changes to the deformation-induced defects is discussed. The infrared spectra show the existence of broad bands at 0.95 and 1.27 eV. However, these emissions were found to be rather insensitive to deformation.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipDGES
dc.description.sponsorshipThe Russian Fund for Fundamental Studies
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26362
dc.identifier.doi10.1088/0268-1242/14/5/010
dc.identifier.issn0268-1242
dc.identifier.officialurlhttp://dx.doi.org/10.1088/0268-1242/14/5/010
dc.identifier.relatedurlhttp://iopscience.iop.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59136
dc.issue.number5
dc.journal.titleSemiconductor Science and Technology
dc.language.isoeng
dc.page.final434
dc.page.initial430
dc.publisherIop Publishing Ltd
dc.relation.projectIDPB96-0639
dc.relation.projectID98-01-01084
dc.relation.projectID96-01-196825
dc.rights.accessRightsrestricted access
dc.subject.cdu538.9
dc.subject.keywordCathodoluminescence
dc.subject.keywordZnse
dc.subject.ucmFísica de materiales
dc.titleDeformation-induced defect levels in ZeSe crystals
dc.typejournal article
dc.volume.number14
dcterms.references[1] Dominguez-Adame F, Piqueras J and Fernández P 1991 Appl. Phys. Lett. 58 257 [2] Fernández P, Piqueras J, García J A, Remón A and Muñooz V 1998 Semicond. Sci. Technol. 13 410 [3] Karai M, Kido K, Naito H, Kurosawa K and Okuda M 1991 J. Appl. Phys. 69 291 [4] Liang W Y and Yoffe A D 1967 Philos. Mag. 16 1153 [5] Stringfellow G B and Bube R H 1968 Phys. Rev. 171 903 [6] Thomas A E, Russell G J and Woods J 1984 J. Phys. C: Solid State Phys. 17 6219 [7] Godlewski M, Lamb W E and Cavenett B C 1981 Solid State Commun. 39 595 [8] Allen J W 1995 Semicond. Sci. Technol. 10 1049 [9] Pal U, Fern´andez P, Piqueras J, Sochinskii N V and Diéguez E 1995 J. Appl. Phys. 78 1992
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