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Peak detector effect in low-dropout regulators

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dc.contributor.authorPalomar Trives, Carlos
dc.contributor.authorFranco Peláez, Francisco Javier
dc.contributor.authorLópez Calle, Isabel
dc.contributor.authorGonzález Izquierdo, Jesús
dc.contributor.authorAgapito Serrano, Juan Andrés
dc.date.accessioned2023-06-19T13:28:47Z
dc.date.available2023-06-19T13:28:47Z
dc.date.issued2013-08
dc.description(c) 2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works
dc.description.abstractThe peak detector effect is a phenomenon that makes single event transients much longer once an error amplifier switches from linear to saturation zone due to the presence of external capacitors. This is so-called since it was discovered in a simple voltage reference in which a parasitic lossy peak detector was unwillingly built in the output stage. In this paper, peak detector effect is generalized to explain the appearance of long duration pulses in typical low dropout voltage regulator built with discrete devices. This effect has been related to the way in which the negative feedback loop is closed and to the kind of pass device in the output stage. Thus, if the linear voltage regulator consists in an error amplifier the output of which controls a current source, the peak detector effect will occur if the current source is unidirectional, the output load does not drain enough current and is in parallel with an external capacitor.
dc.description.departmentDepto. de Estructura de la Materia, Física Térmica y Electrónica
dc.description.departmentDepto. de Química Física
dc.description.facultyFac. de Ciencias Físicas
dc.description.facultyFac. de Ciencias Químicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Ciencia e Innovación
dc.description.sponsorshipUniversidad Complutense de Madrid
dc.description.sponsorshipBanco Santander - Central Hispano
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/28857
dc.identifier.doi10.1109/TNS.2012.2232305
dc.identifier.issn0018-9499
dc.identifier.officialurlhttp://dx.doi.org/10.1109/TNS.2012.2232305
dc.identifier.relatedurlhttp://ieeexplore.ieee.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/33822
dc.issue.number4
dc.journal.titleIEEE transactions on nuclear science
dc.language.isospa
dc.page.final2674
dc.page.initial2666
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc
dc.relation.projectIDAYA2009-13300-C03-03
dc.relation.projectIDConsolider SAUUL CSD2007-00013
dc.rights.accessRightsopen access
dc.subject.cdu537
dc.subject.keywordAmplifiers
dc.subject.keywordCapacitors
dc.subject.keywordVoltage regulators
dc.subject.keywordCurrent source
dc.subject.keywordDiscrete devices
dc.subject.keywordError amplifier switch
dc.subject.keywordExternal capacitors
dc.subject.keywordNegative feedback loop
dc.subject.keywordParasitic lossy peak detector
dc.subject.keywordPeak detector effect
dc.subject.keywordSaturation zone
dc.subject.keywordSingle event transients
dc.subject.keywordTypical low dropout voltage regulator
dc.subject.keywordVoltage reference
dc.subject.keywordDetectors
dc.subject.keywordRegulators
dc.subject.keywordResistors
dc.subject.keywordTransient analysis
dc.subject.keywordTransistors
dc.subject.keywordVoltage control
dc.subject.keywordLong duration pulses
dc.subject.keywordLossy peak detector effect
dc.subject.keywordOperational amplifiers
dc.subject.ucmElectrónica (Física)
dc.subject.ucmGeología
dc.subject.ucmInformática (Informática)
dc.subject.ucmCircuitos integrados
dc.subject.unesco2506 Geología
dc.subject.unesco1203.17 Informática
dc.subject.unesco2203.07 Circuitos Integrados
dc.titlePeak detector effect in low-dropout regulators
dc.typejournal article
dc.volume.number60
dcterms.references[1] Y. Boulghassoul, S. Buchner, D. McMorrow, V. Pouget, L. Massengill, P. Fouillat, W. Holman, C. Poivey, J. Howard, M. Savage, and M. Maher, “Investigation of millisecond-long analog single-event transients in the LM6144 op amp,” IEEE Transactions on Nuclear Science, vol. 51, no. 6, pp. 3529–3536, Dec. 2004. [2] P. C. Adell, A. F. Witulski, R. D. Schrimpf, R. Marec, V. Pouget, P. Calvel, and F. Bezerra, “Single Event-Induced Instability in Linear Voltage Regulators,” IEEE Transactions on Nuclear Science, vol. 53, no. 6, pp. 3506–3511, Dec. 2006. [3] A. H. Johnston, T. F. Miyahira, F. Irom, and J. S. Laird, “SingleEvent Transients in Voltage Regulators,” IEEE Transactions on Nuclear Science, vol. 53, no. 6, pp. 3455–3461, Dec. 2006. [4] A. Zanchi, S. Buchner, C. Hafer, S. Hisano, and D. Kerwin, “Investigation and Mitigation of Analog SET on a Bandgap Reference in TripleWell CMOS Using Pulsed Laser Techniques,” IEEE Transactions on Nuclear Science, vol. 58, no. 6, pp. 2570–2577, Dec. 2011. [5] B. S. Lee, “Technical Review of Low Dropout Voltage Regulator Operation and Performance,” On line: http://www.ti.com/litv/pdf/slva072, Tech. Rep., Aug. 1998. [6] P. Adell, R. Schrimpf, W. Holman, J. Todd, S. Caveriviere, R. Cizmarik, and K. Galloway, “Total dose effects in a linear voltage regulator,” IEEE Transactions on Nuclear Science, vol. 51, no. 6, pp. 3816–3821, Dec. 2004. [7] A. Kelly, P. Adell, A. Witulski, W. Holman, R. Schrimpf, and V. Pouget, “Total Dose and Single Event Transients in Linear Voltage Regulators,” IEEE Transactions on Nuclear Science, vol. 54, no. 4, pp. 1327–1334, Aug. 2007. [8] F. Irom, T. Miyahira, P. Adell, J. Laird, B. Conder, V. Pouget, and F. Essely, “Investigation of Single-Event Transients in Linear Voltage Regulators,” IEEE Transactions on Nuclear Science, vol. 55, no. 6, pp. 3352–3359, Dec. 2008. [9] F. J. Franco, I. López-Calle, J. G. Izquierdo, and J. A. Agapito, “Modification of the LM124 Single Event Transients by Load Resistors,” IEEE Transactions on Nuclear Science, vol. 57, no. 1, pp. 358–365, Feb. 2010. [10] G. Allen, P. C. Adell, D. Chen, and P. Musil, “Single-Event Transient Testing of Low Dropout PNP Series Linear Voltage Regulators,” presented at NSREC 2012 and sent for publication on IEEE Transactions on Nuclear Science.
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relation.isAuthorOfPublication662ba05f-c2fc-4ad7-9203-36924c80791a
relation.isAuthorOfPublication.latestForDiscovery662ba05f-c2fc-4ad7-9203-36924c80791a

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