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Effect of photodiode angular response on surface plasmon resonance measurements in the Kretschmann-Raether configuration

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dc.contributor.authorGálvez Alonso, Fernando
dc.contributor.authorMonton, C.
dc.contributor.authorSerrano, A., A.
dc.contributor.authorValmianski, I.
dc.contributor.authorDe la Venta, J.
dc.contributor.authorSchuller, Ivan K.
dc.contributor.authorGarcia, M. A.
dc.date.accessioned2023-06-20T00:30:41Z
dc.date.available2023-06-20T00:30:41Z
dc.date.issued2012-09
dc.description© 2012 American Institute of Physics. Alberto Gil and Carlos Alonso are acknowledged by technical help with the experimental setup. This work was supported by CSIC (project I-LINK0400) and the Spanish Ministry of Science and innovation through the project FIS-2008-06249, Comunidad de Madrid, project NANOBIOMAGNET (S2009/MAT-1726) and AFOSR Project No. FA 9550-10-1-0409. J. de la Venta acknowledges the support of a postdoctoral fellowship from Ministry for Education of Spain.
dc.description.abstractWe study the effect of photodiode angular response on the measurement of surface plasmon resonance (SPR) in metallic thin films using the Kretschmann-Raether configuration. The photodiode signal depends not only on the light intensity but also on the incidence angle. This mplies that the photodiode sensitivity changes along the SPR curve. Consequently, the measured SPR spectrum is distorted, thus affecting fits and numerical analyses of SPR curves. We analyze the magnitude of this change, determine when it is significant, and develop a calibration method of the experimental setup which corrects for this type of spectral shape distortions.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Ciencia e Innovación (MICINN)
dc.description.sponsorshipComunidad de Madrid
dc.description.sponsorshipCSIC
dc.description.sponsorshipAFOSR
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/43055
dc.identifier.doi10.1063/1.4748521
dc.identifier.issn0034-6748
dc.identifier.officialurlhttp://dx.doi.org/10.1063/1.4748521
dc.identifier.relatedurlhttp://aip.scitation.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/42671
dc.issue.number9
dc.journal.titleReview of scientific instruments
dc.language.isoeng
dc.publisherElsevier Science S A
dc.relation.projectIDFIS-2008-06249
dc.relation.projectIDNANOBIOMAGNET (S2009/MAT-1726)
dc.relation.projectIDI-LINK0400
dc.relation.projectIDFA 9550-10-1-0409
dc.rights.accessRightsopen access
dc.subject.cdu538.9
dc.subject.keywordOptical-Constants
dc.subject.keywordFilms
dc.subject.keywordMetals
dc.subject.ucmFísica de materiales
dc.subject.ucmFísica del estado sólido
dc.subject.unesco2211 Física del Estado Sólido
dc.titleEffect of photodiode angular response on surface plasmon resonance measurements in the Kretschmann-Raether configuration
dc.typejournal article
dc.volume.number83
dspace.entity.typePublication

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