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Structural, electronic and magnetic properties of the surfaces of tetragonal and cubic HfO_(2)

dc.contributor.authorBeltrán Fínez, Juan Ignacio
dc.contributor.authorMuñoz, María del Carmen
dc.contributor.authorHafner, J.
dc.date.accessioned2023-06-20T10:57:19Z
dc.date.available2023-06-20T10:57:19Z
dc.date.issued2008-06-25
dc.description© IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. The Madrid–Vienna cooperation has been initiated by a Marie-Curie Fellowship for J I Beltrán in the MC-Training Site ‘Atomic-scale computational materials science’ at the Universität Wien. Partial support by the Spanish Ministerio de Educación y Ciencia under contract no MAT2006-05122 is gratefully acknowledged.
dc.description.abstractWe present ab initio density-functional theory (DFT) calculations of the structure and stability of the monoclinic (m), tetragonal (t) and cubic (c) phases of HfO_(2) and of the stability and the structural, electronic, and magnetic properties of the polar (001) surface of t-HfO_(2) and the (100) and (111) surfaces of c-HfO_(2). We show that on all three surfaces, a termination by Hf leads to a metallic and non-magnetic surface, while surfaces covered by a full monolayer of O are predicted to be half-metallic and ferromagnetic, the magnetisms being induced by the Coulomb repulsion between p-holes in the O-2p valence band. In contrast, the partially reduced surfaces terminated by half a monolayer of oxygen are found to be insulating and non-magnetic. Ab initio statistical mechanics in combination with the DFT total-energy calculations show that the partially reduced surfaces are stable over the entire range of admissible values of the chemical potential of oxygen. Investigations of the formation of Hf vacancies on the Hf- and O-terminated surfaces of tetragonal HfO_(2) demonstrate that under oxidizing conditions, the formation of Hf subsurface vacancies is energetically favored on the partially reduced O-terminated surface. The formation of Hf vacancies causes the creation of holes in the O-2p valence band and of magnetic moments on the surrounding O atoms. That the formation of near-surface Hf vacancies on the O-terminated surface is energetically favored is in contrast to a high formation energy for neutral Hf vacancies in bulk HfO2 and suggests a cooperative mechanism between surface- and vacancy-formation. We discuss our findings in relation to recent reports on ferromagnetism in ultrathin HfO_(2) films and other models for the formation of p-wave ferromagnetism.
dc.description.departmentDepto. de Estructura de la Materia, Física Térmica y Electrónica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipSpanish Ministerio de Educación y Ciencia
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/31406
dc.identifier.doi10.1088/1367-2630/10/6/063031
dc.identifier.issn1367-2630
dc.identifier.officialurlhttp://dx.doi.org/10.1088/1367-2630/10/6/063031
dc.identifier.relatedurlhttp://iopscience.iop.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/51508
dc.journal.titleNew journal of physics
dc.language.isoeng
dc.publisherIOP Publishing
dc.relation.projectIDMAT2006-05122
dc.rightsAtribución 3.0 España
dc.rights.accessRightsopen access
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/es/
dc.subject.cdu537
dc.subject.keywordGeneralized gradient approximation
dc.subject.keywordTotal-energy calculations
dc.subject.keywordAugmented-wave method
dc.subject.keywordLayer-deposited ZrO2
dc.subject.keywordX-ray-diffraction
dc.subject.keywordThin-films
dc.subject.keywordTitanium-dioxide
dc.subject.keywordBasis-set
dc.subject.keywordFerromagnetism
dc.subject.keywordOxides.
dc.subject.ucmElectricidad
dc.subject.ucmElectrónica (Física)
dc.subject.unesco2202.03 Electricidad
dc.titleStructural, electronic and magnetic properties of the surfaces of tetragonal and cubic HfO_(2)
dc.typejournal article
dc.volume.number10
dcterms.references[1] Wilk, G., Wallace, R. M., Anthony, J. M., 2001, J. Appl. Phys., 89, 5243. [2] Fonseca, L. R. C., Demkov, A. A., Knizhnik, A., 2003, Phys. Status Solidi b, 239, 48. [3] Robertson, J., 2006, Rep. Prog. Phys., 69, 327. [4] Ginley, D. S., Bright. C., 2000, MRS Bull., 25, 15. [5] Diebold, U., 2003, Surf. Sci. Rep., 48, 53. [6] Batzill, M., Diebold, U., 2005, Prog. Surf. Sci., 79, 47. [7] Matsumoto, Y., Murakami, M., Shono, T., Hasegawa, T., Fukumura, T., Kawasaki, M., 2001, Science, 291, 854. [8] Wang, Z., Wang, W., Tang, J., Tung, L. D., Spinu, L., Zhou, W., 2003, Appl. Phys. Lett., 83, 518. [9] Ogale, S. B., et al, 2003, Phys. Rev. Lett., 91, 77205. [10] Venkatesan, M., Fitzgerald, C. B., Lunney, J. G., Coey, J. M. D., 2004, Phys. Rev. Lett., 93, 177206. [11] Coey, J. M. D., 2005, J. Appl. Phys., 97, 10D313. [12] Coey, J. M. D., 2006, Curr. Opin. Solid State Mater. Sci., 10, 83. [13] Venkatesan, M., Fitzgerald, C. B., Coey, J. M. D., 2004, Nature, 430, 630. [14] Kittilstved, K. R., Liu, W. K., Gamelin, D. R., 2006, Nat. Mater., 5, 29. [15] Coey, J. M. D., 2005, Solid State Sci., 7, 660. [16] Sundaresan, A., Bhargavi, R., Rangarajan, N., Siddesh, U., Rao, C. N. R., 2006, Phys. Rev. B, 74, 161306. [17] Coey, J. M. D., Venkatesan, M., Stamenov, P., Firtgerald, C. B., Dorneles, L. S., 2005, Phys. Rev. B, 72, 024450. [18] Hong, N. H., Sakai, J., Poirot, N., Brizé, V., 2006, Phys. Rev. B, 73, 132404. [19] Pemmaraju, C. D., Sanvito, S., 2005, Phys. Rev. Lett., 94, 217205. [20] Stoneham, A. M., 1975, Theory of Defects in Solids (Oxford: Clarendon), chapter 16. [21] Efimov, I. S., Yunoki, S., Sawatzki, G. A., 2002, Phys. Rev. Lett., 89, 216403. [22] Weng, H., Dong, J., 2006, Phys. Rev. B, 73, 132410. [23] Makarova, T. L., 2004, Semiconductors, 38, 615. [24] Young, D. P., Hall, D., Torelli, M. E., Fisk, Z., Sarrao, J. L., Thomson, J. D., Ott, H. R., Oseroff, S. B., Goodrich, R. G., Zysler, R., 1999, Nature, 397, 412. [25] Gallego, S., Beltrán, J. I., Cerdá, J., Muñoz, M. C., 2005, J. Phys.: Condens. Matter, 17, L451. [26] Mukhopadhyay, A. B., Sanz, J. F., Musgrave, C. B., 2006, Phys. Rev. B, 73, 115330. [27] Tkachev, S. N., Manghnani, M. H., Niilisk, A., Aarik, J., Mandar, H., 2005, J. Mater. Sci., 40, 4293. [28] Tkachev, S. N., Manghnani, M. H., Niilisk, A., Aarik, J., Mändar, H., 2005, Spectrochim. Acta A, 61, 2434. [29] Kresse, G., Hafner, J., 1993, Phys. Rev. B, 48, 13115. [30] Kresse, G., Furthmüller, J., 1996, Comput. Mater. Sci., 6, 15. [31] Kresse, G., Furthmüller, J., 1996, Phys. Rev. B, 54, 11169. [32] Blöchl, P., 1994, Phys. Rev. B, 50, 17, 953. [33] Kresse, G., Joubert, D., 1999, Phys. Rev. B, 59, 1758. [34] Perdew, J. P., Burke, K., Ernzerhof, M., 1996, Phys. Rev. Lett., 77, 3865. [35] Monkhorst, H. J., Pack, J. D., 1972, Phys. Rev. B, 13, 5188. [36] Vosko, S. H., Wilk, L., Nusair, M., 1980, Can. J. Phys., 58, 1200. [37] Liu, L. G., 1979, Earth Planet. Sci. Lett., 44, 390. [38] Haines, J., Leger, J. M., Atouf, A., 1995, J. Am. Ceram. Soc., 78, 445. [39] Jaffe, J. E., Bachorz, R. A., Gutowski, M., 2005, Phys. Rev. B, 72, 144107. [40] Kang, J., Lee, E. C., Chang, K. J., 2003, Phys. Rev. B, 68, 054106. [41] Zhao, X., Vanderbilt, D., 2002, Phys. Rev. B, 65, 233106. [42] Foster, A. S., López Gejo, F., Shluger, A. L., Nieminen, R. M., 2002, Phys. Rev. B, 65, 174117. [43] Adams, D. M., Leonard, S., Russel, D. R., Cernik, R. J., 1991, J. Phys. Chem. Solids, 52, 1181. [44] Stacy, D. W., Johnstone, J. K., Wilder, D. R., 1972, J. Am. Ceram. Soc., 55, 482. [45] Wang, J., Li, H. P., Stevens, R., 1992, J. Mater. Sci., 27, 5397. [46] Balog, M., Schieber, M., Michiman, M., Patai, S., 1977, Thin Solid Films, 41, 247. [47] Oshima, M., Toyoda, S., Okumura, T., Okabayashi, J., Kumigashira, H., 2003, Appl. Phys. Lett., 83, 2172. [48] Desgreniers, S., Lagarec, K., 1999, Phys. Rev. B, 59, 8467. [49] Leger, J. M., Atouf, A., Tomaszweski, P. E., Pereira, A. S., 1993, Phys. Rev. B, 48, 93. [50] Perdew, J. P., Chevary, A., Vosko, S. H., Jackson, K. A., Pedersen, M. R., Singh, D. J., Fiolhais, C., 1992, Phys. Rev. B, 46, 6671. [51] Louie, S. G., Froyen, S., Cohen, M. L., 1982, Phys. Rev. B, 26, 1738. [52] Reuter, K., Scheffler, M., 2002, Phys. Rev. B, 65, 035406. [53] Eichler, A., Kresse, G., Phys. Rev. B, 69, 045402. [54] Rohrbach, A., Hafner, J., Kresse, G., 2004, Phys. Rev. B, 69, 075413. [55] Rollmann, G., Rohrbach, A., Entel, P., Hafner, J., 2004, Phys. Rev. B, 69, 165107. [56] Zheng, J. X., Ceder, G., Maxisch, T., Chim, W. K., Choi, W. K., 2007, Phys. Rev. B, 75, 104112. [57] Sánchez, N., Gallego, S., Muñoz, M. C., to be published. [58] Kusabe, K., Geshi, M., Tsukamoto, H., Suzuki, N., 2004, J. Phys.: Condens. Matter, 16, 5639. [59] Sieberer, M., Redinger, J., Khmelevskyi, S., Mohn, P., 2006, Phys. Rev. B, 73, 024404.
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