Temperature-dependence of scanning electron acoustic microscopy signal in MgO and SIC

dc.contributor.authorUrchulutegui, M.
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.date.accessioned2023-06-20T19:07:55Z
dc.date.available2023-06-20T19:07:55Z
dc.date.issued1991-03-15
dc.description© 1991 American institute of Physics. This work has been supported by the Volkswagen Foundation and by the Comisión Interministerial de Ciencia y Tecnología (Project PB86-015 1).
dc.description.abstractThe variation of the electron acoustic signal as a function of temperature in ceramic materials has been studied. Scanning electron acoustic microscopy (SEAM) contrast in MgO single crystals and in reaction bonded SiC, between 100 and 273 K, is discussed and compared. SEAM signal and contrast have been found to be temperature dependent in both materials as a consequence of the temperature dependence of several material parameters.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipVolkswagen Foundation
dc.description.sponsorshipComisidn Interministerial de Ciencia y Tecnología
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/27026
dc.identifier.doi10.1063/1.348502
dc.identifier.issn0021-8979
dc.identifier.officialurlhttp://dx.doi.org/10.1063/1.348502
dc.identifier.relatedurlhttp://scitation.aip.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59288
dc.issue.number6
dc.journal.titleJournal of Applied Physics
dc.language.isoeng
dc.page.final3591
dc.page.initial3589
dc.publisherAmerican Institute of Physics
dc.relation.projectIDPB86-0151
dc.rights.accessRightsopen access
dc.subject.cdu538.9
dc.subject.keywordPhysics
dc.subject.keywordApplied
dc.subject.ucmFísica de materiales
dc.titleTemperature-dependence of scanning electron acoustic microscopy signal in MgO and SIC
dc.typejournal article
dc.volume.number69
dcterms.references1. G. S. Cargill, Nature 286, 691 ( 1980) 2. L. .I. Balk, in Advances in Electronics and Electron Physics (Academic, New York, 1988), Vol. 71, p. 1. 3. W. L. Holstein, J. Electron Microscopy Technique 5,91 ( 1987). 4. M. Urchulutegui, J. Piqueras, and J. Llopis, J. Appl. Phys. 65, 2677 (1989). 5. M. Urchulutegui and J. Piqueras, J. Appl. Phys. 67, 1 ( 1990). 6. L. J. Balk and N. Kultscher, Inst. Phys. Conf. Ser. 67, 387 ( 1983). 7. W. L. Holstein, J. Appl. Phys. 58, 2008 ( 1985). 8. M. Domnik and L. J. Balk, in Proceedings of the 6th International Topical Meeting on Photoacoustic and Photothermal Phenomena, Baltimore, MD, 1989, edited by J. C. Murphy. 9. D. G. Davies, Phil. Trans. R. Sot. Lond. A 320, 243 ( 1986). 10. P FernBndez, J. Llopis and J. Piqueras, Mat. Chem. Phys. 24, 215 (1989). 11. G. R. Sawyer and T. F. Page, J. Mater. Sci. 13,885 (1978). 12. J. N. Ness and T. F. Page, J. Mater. Sci. 21, 1377 ( 1986).
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relation.isAuthorOfPublication68dabfe9-5aec-4207-bf8a-0851f2e37e2c
relation.isAuthorOfPublication.latestForDiscovery68dabfe9-5aec-4207-bf8a-0851f2e37e2c

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