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Modification of the LM124 single event transients by load resistors

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dc.contributor.authorFranco Peláez, Francisco Javier
dc.contributor.authorLópez Calle, Isabel
dc.contributor.authorGonzález Izquierdo, Jesús
dc.contributor.authorAgapito Serrano, Juan Andrés
dc.date.accessioned2023-06-20T03:48:20Z
dc.date.available2023-06-20T03:48:20Z
dc.date.issued2010-02
dc.description(c) 2010 IEEE. Personal use of this material is ermitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
dc.description.abstractThe influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients. SPICE simulations helped to understand the reasons of this behavior and showed that the distortion is related to the necessity of providing or absorbing current from the load resistor, which forces the amplifier to modify its operation point. Finally, load effects were successfully used to explain the distortion of single event transients in typical feed-back networks and the results were used to explain experimental data reported elsewhere.
dc.description.departmentDepto. de Estructura de la Materia, Física Térmica y Electrónica
dc.description.departmentDepto. de Química Física
dc.description.facultyFac. de Ciencias Físicas
dc.description.facultyFac. de Ciencias Químicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/28855
dc.identifier.issn0018-9499
dc.identifier.officialurlhttp://dx.doi.org/10.1109/TNS.2009.2037894
dc.identifier.relatedurlhttps://sites.google.com/site/fjfrancopelaez/
dc.identifier.relatedurlhttp://pendientedemigracion.ucm.es/info/dinalaser/jesus.html
dc.identifier.relatedurlhttp://ieeexplore.ieee.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/44473
dc.issue.number1
dc.journal.titleIEEE transactions on nuclear science
dc.language.isoeng
dc.page.final365
dc.page.initial358
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc
dc.relation.projectIDEMULASER (CDTI/PNE-034/2006)
dc.relation.projectIDConsolider SAUUL CSD2007-00013
dc.rights.accessRightsopen access
dc.subject.cdu537
dc.subject.keywordSPICE
dc.subject.keywordOperational amplifiers
dc.subject.keywordResistors
dc.subject.keywordLM124 Operational amplifier
dc.subject.keywordSPICE Simulation
dc.subject.keywordDistortion
dc.subject.keywordFeedback network
dc.subject.keywordLaser test
dc.subject.keywordLoad effect
dc.subject.keywordLoad resistor
dc.subject.keywordSingle event transients
dc.subject.keywordAbsorption
dc.subject.keywordCritical current
dc.subject.keywordLaser noise
dc.subject.keywordOptical pulse generation
dc.subject.keywordPulse amplifiers
dc.subject.keywordShape
dc.subject.keywordTesting
dc.subject.keywordLM124
dc.subject.keywordLaser irradiation
dc.subject.keywordLoad effects
dc.subject.keywordOperational amplifier
dc.subject.keywordTwo-photon absorption
dc.subject.ucmElectrónica (Física)
dc.subject.ucmCircuitos integrados
dc.subject.unesco2203.07 Circuitos Integrados
dc.titleModification of the LM124 single event transients by load resistors
dc.typejournal article
dc.volume.number57
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