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A methodology for automatic insertion of selective TMR in digital circuits affected by SEUs

dc.contributor.authorRuano Ramos, Óscar
dc.contributor.authorMaestro De La Cuerda, Juan Antonio
dc.contributor.authorReviriego, Pedro
dc.date.accessioned2024-11-05T15:17:32Z
dc.date.available2024-11-05T15:17:32Z
dc.date.issued2009
dc.description.abstractIn this paper, a methodology to perform automatic selective TMR insertion on digital circuits is presented, having as a constraint the required reliability level. Such reliability is guaranteed while reducing the area compared to TMR. In addition, a performance enhancement is proposed in order to guarantee a computation time feasible for this automatic selective TMR insertion methodology. It focuses on the choice of a starting point close enough to an optimal solution. The method consists in the analysis of the topological features of the target circuit which will help the optimization engine to identify those flip-flops more susceptible to be tripled depending on the showed sensitivity to SEUs.
dc.description.departmentDepto. de Arquitectura de Computadores y Automática
dc.description.facultyFac. de Informática
dc.description.refereedTRUE
dc.description.sponsorshipSpanish Ministry of Science and Education
dc.description.statuspub
dc.identifier.doi10.1109/TNS.2009.2014563
dc.identifier.urihttps://hdl.handle.net/20.500.14352/110015
dc.issue.number4
dc.journal.titleIEEE Transactions on Nuclear Science
dc.language.isoeng
dc.page.final2102
dc.page.initial2091
dc.publisherIEEE
dc.relation.projectIDESP-2006-04163
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internationalen
dc.rights.accessRightsopen access
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subject.ucmInformática (Informática)
dc.subject.unesco33 Ciencias Tecnológicas
dc.titleA methodology for automatic insertion of selective TMR in digital circuits affected by SEUs
dc.typejournal article
dc.type.hasVersionVoR
dc.volume.number56
dspace.entity.typePublication
relation.isAuthorOfPublication95187897-eab3-4024-bac1-7c08dba018b7
relation.isAuthorOfPublication2112fcdc-ac71-46d6-9857-a935bbcbca87
relation.isAuthorOfPublication.latestForDiscovery95187897-eab3-4024-bac1-7c08dba018b7

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