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Impact of Ground-Level Enhancement (GLE) Solar Events on Soft Error Rate for Avionics

dc.contributor.authorHubert, Guillaume
dc.contributor.authorAubry, Sébastien
dc.contributor.authorClemente Barreira, Juan Antonio
dc.date.accessioned2023-06-17T08:59:20Z
dc.date.available2023-06-17T08:59:20Z
dc.date.issued2020-03-02
dc.description.abstractThis article proposes to study the impact of ground-level enhancement (GLE) induced by extreme solar flares on the soft error rate (SER) for flight representatives to the world-air traffic. A GLE physical model was confronted to cosmic ray variations measured with neutron monitors during the GLEs 5 and 69. Based on said GLE physical model and single-event upset occurrence models, investigations were performed to assess the SER during these GLEs for a bulk 90-nm commercial off-the-shelf SRAM. The main conclusion is that the GLE impact must be considered in the risk assessment, which requires a physical description of the additional solar cosmic rays and a realistic consideration of the air traffic.
dc.description.departmentDepto. de Arquitectura de Computadores y Automática
dc.description.facultyFac. de Informática
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/64129
dc.identifier.doi10.1109/TAES.2020.2977792
dc.identifier.issn0018-9251
dc.identifier.officialurlhttps://ieeexplore.ieee.org/document/9020117
dc.identifier.urihttps://hdl.handle.net/20.500.14352/7833
dc.issue.number5
dc.journal.titleIEEE Transactions on Aerospace and Electronic Systems
dc.language.isoeng
dc.page.final3684
dc.page.initial3674
dc.publisherThe Institute of Electrical and Electronics Engineers (IEEE)
dc.rights.accessRightsopen access
dc.subject.ucmCircuitos integrados
dc.subject.ucmHardware
dc.subject.ucmElectrónica (Informática)
dc.subject.unesco2203.07 Circuitos Integrados
dc.subject.unesco2203 Electrónica
dc.titleImpact of Ground-Level Enhancement (GLE) Solar Events on Soft Error Rate for Avionics
dc.typejournal article
dc.volume.number56
dspace.entity.typePublication
relation.isAuthorOfPublication919b239d-a500-4adb-aacf-00206a2c1512
relation.isAuthorOfPublication.latestForDiscovery919b239d-a500-4adb-aacf-00206a2c1512

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