Use of Kramers-Kronig transforms for the treatment of admittance spectroscopy data of p-n junctions containing traps
dc.contributor.author | León Yebra, Carlos | |
dc.contributor.author | Martín, J. M. | |
dc.contributor.author | Santamaría Sánchez-Barriga, Jacobo | |
dc.contributor.author | Skarp, J. | |
dc.contributor.author | González Díaz, Germán | |
dc.contributor.author | Sánchez Quesada, Francisco | |
dc.date.accessioned | 2023-06-20T20:08:34Z | |
dc.date.available | 2023-06-20T20:08:34Z | |
dc.date.issued | 1996-05-15 | |
dc.description | © 1996 American Institute of Physics. | |
dc.description.abstract | The use of Kramers–Kronig transforms is proposed for the treatment of admittance spectroscopy data of junctions when significant shunt conductance or series resistance is present. An algorithm has been implemented to calculate the transformations numerically and the validity of the method developed has been tested using simulated data. Two experimental systems, p-n junctions into InP made by ion implantation, and atomic-layer-epitaxy-grown CdS/CdTe heterojunctions, have been characterized using this procedure. | |
dc.description.department | Depto. de Estructura de la Materia, Física Térmica y Electrónica | |
dc.description.faculty | Fac. de Ciencias Físicas | |
dc.description.refereed | TRUE | |
dc.description.status | pub | |
dc.eprint.id | https://eprints.ucm.es/id/eprint/31278 | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.officialurl | http://web.ebscohost.com/ehost/detail?sid=b9f68371-0c3a-48c0-9888-622394b0dea2%40sessionmgr114&vid=1&hid=118&bdata=Jmxhbmc9ZXMmc2l0ZT1laG9zdC1saXZl#db=aph&AN=7663090 | |
dc.identifier.relatedurl | http://web.b.ebscohost.com/ | |
dc.identifier.uri | https://hdl.handle.net/20.500.14352/59661 | |
dc.issue.number | 10 | |
dc.journal.title | Journal of applied physics | |
dc.language.iso | eng | |
dc.page.final | 7836 | |
dc.page.initial | 7830 | |
dc.publisher | American Institute of Physics | |
dc.rights.accessRights | open access | |
dc.subject.cdu | 537 | |
dc.subject.keyword | High-resistivity | |
dc.subject.keyword | InP. | |
dc.subject.ucm | Electricidad | |
dc.subject.ucm | Electrónica (Física) | |
dc.subject.unesco | 2202.03 Electricidad | |
dc.title | Use of Kramers-Kronig transforms for the treatment of admittance spectroscopy data of p-n junctions containing traps | |
dc.type | journal article | |
dc.volume.number | 79 | |
dcterms.references | 1) D. L. Losee, J. Appl. Phys., 46, 2204 (1975). 2) J. L. Pautrat, B. Katircioglu, N. Magnea, J. C. Pfister, L. Revoil, Solid-State Electron., 23, 1159 (1980). 3) C. Ghezzi, Appl. Phys. A, 23, 191 (1981). 4) Impedance Spectroscopy—Emphasizing Solid Materials and Systems, edited by J. R. Macdonald (Wiley-Interscience, New York, 1987). 5) B. A. Boukamp, J. R. Macdonald, Solid State Ionics, 74, 85 (1994). 6) J. R. Macdonald, J. Chem. Phys., 102, 6241 (1995). 7) B. A. Boukamp, Solid State Ionics, 62, 131 (1993). 8) M. Urquidi-Macdonald, S. Real, D. D. Macdonald, Electrochim. Acta, 35, 1559 (1990). 9) J. R. Macdonald, Electrochim. Acta, 38, 1883 (1993). 10) A. K. Jonscher, Dielectric Relaxation in Solids (Chelsea Dielectric, London, 1983). 11) R. Wooldridge, An Introduction to Computing (Oxford University Press, London, 1962). 12) B. A. Boukamp, J. Electrochem. Soc., 142, 1885 (1995). 13) J. M. Martín, S. García, F. Calle, I. Mártil, G. González-Díaz, J. Electron. Mater., 24, 59 (1995). 14) M. W. Focht, A. T. Macrander, B. Schwartz, L. C. Feldman, J. Appl. Phys., 55, 3859 (1984). 15) J. Skarp, Y. Koskinen, S. Lindfors, A. Rautiainen, T. Suntola, in Proceedings of the 10th European Photovoltaic Solar Energy Conference Lisbon, Portugal, April 8–12, 1991, p. 567. 16) J. Skarp, E. Anttila, A. Rautiainen, T. Suntola, Int. J. Sol. Energy, 12, 137 (1992). 17) S. J. Pearton, C. R. Abernathy, M. B. Panish, R. A. Hamm, L. M. Lunardi, J. Appl. Phys., 66, 656 (1989). | |
dspace.entity.type | Publication | |
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relation.isAuthorOfPublication.latestForDiscovery | 213f0e33-39f1-4f27-a134-440d5d16a07c |
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