Evolution of the structural and magnetic properties of sputtered Tb_xFe_(73)Ga_(27-x) (7 at.% ≤ x ≤ 11 at.%) thin films upon the increase of Tb content

Abstract

TbxFe_(73)Ga_(27-x) (7 at.% ≤ x ≤ 11 at.%) ternary alloys have been obtained by cosputtering from Tb_(33)Fe_(67) and Fe_(72)Ga_(28) targets. In contrast with other Tb-Fe-Ga compounds that consist of just one structural phase, the diffraction pattern of the Tb_7Fe_(73)Ga_(20) shows the presence of two different phases related to binary Tb-Fe and Fe-Ga alloys. This microstructure evolves as the Tb content is increased, and for a Tb of 11 at.% x-ray diffractometry only evidences the presence of a phase close to the TbFe_2. Although none of the studied samples show perpendicular magnetic anisotropy, there is a significant component of the magnetization perpendicular to the sample plane. The increase of the Tb content on the compounds from 7 at.% to 11 at.% enhances this component most probably due to the shift of the microstructure towards one similar to the TbFe_2.