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An efficient technique to protect serial shift registers against soft errors

dc.contributor.authorReviriego, Pedro
dc.contributor.authorRuano Ramos, Óscar
dc.contributor.authorFlanagan, Mark
dc.contributor.authorPontarelli, Salvatore
dc.contributor.authorMaestro De La Cuerda, Juan Antonio
dc.date.accessioned2024-11-05T15:34:39Z
dc.date.available2024-11-05T15:34:39Z
dc.date.issued2013
dc.description.abstractThis brief presents a technique to efficiently correct single soft errors in serial shift registers. The proposed scheme uses two copies of the shift register. To achieve error correction, data are convolutionally encoded at the input of one of the copies and are decoded at its output. This processing ensures that in that copy, any error affecting a single bit will corrupt its output for multiple cycles. On the other hand, a single-bit error in the original copy will corrupt its output only for one cycle. Therefore, the error patterns can be used to identify the copy that has suffered the error and, consequently, to correct the error. The proposed technique has been implemented in a Hardware Description Language and implemented in a 45-nm library. A fault injection tool has been used to evaluate the effectiveness of the proposed scheme, showing that it can correct all single soft errors. The cost of the proposed approach in terms of circuit area has been compared with a traditional triple-modular redundancy implementation. The results show significant cost reductions, which approach a factor of 33% for large shift registers.
dc.description.departmentDepto. de Arquitectura de Computadores y Automática
dc.description.facultyFac. de Informática
dc.description.refereedTRUE
dc.description.sponsorshipSeventh Framework Programme
dc.description.statuspub
dc.identifier.citationP. Reviriego, O. Ruano, M. F. Flanagan, S. Pontarelli and J. A. Maestro, "An Efficient Technique to Protect Serial Shift Registers Against Soft Errors," in IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 60, no. 8, pp. 512-516, Aug. 2013, doi: 10.1109/TCSII.2013.2268346. keywords: {Delay lines;Shift registers;Tunneling magnetoresistance;Clocks;Convolutional codes;Logic gates;Delay lines;modular redundancy;shift registers;soft errors},
dc.identifier.doi10.1109/TCSII.2013.2268346
dc.identifier.urihttps://hdl.handle.net/20.500.14352/110023
dc.issue.number8
dc.journal.titleIEEE Transactions on Circuits and Systems II: Express Briefs
dc.language.isoeng
dc.page.final516
dc.page.initial512
dc.publisherIEEE
dc.relation.projectIDinfo:eu-repo/grantAgreement/MICINN//AYA2009-13300-C03-02/ES/Estudio Del Efecto De La Radiacion En Fpgas Para Aplicaciones Espaciales Complejas/
dc.rightsAttribution-NonCommercial 4.0 Internationalen
dc.rights.accessRightsmetadata only access
dc.rights.urihttp://creativecommons.org/licenses/by-nc/4.0/
dc.subject.ucmHardware
dc.subject.unesco33 Ciencias Tecnológicas
dc.titleAn efficient technique to protect serial shift registers against soft errors
dc.typejournal article
dc.type.hasVersionVoR
dc.volume.number60
dspace.entity.typePublication
relation.isAuthorOfPublication95187897-eab3-4024-bac1-7c08dba018b7
relation.isAuthorOfPublication2112fcdc-ac71-46d6-9857-a935bbcbca87
relation.isAuthorOfPublication.latestForDiscovery95187897-eab3-4024-bac1-7c08dba018b7

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