The phase space analyzer with Gaussian slits

dc.book.titleLaser-Induced Damage in Optical Materials: 2002 and 7th International Workshop On Laser Beam And Optics Characterization
dc.contributor.authorSerna Galán, Julio
dc.contributor.authorNemes, George
dc.date.accessioned2023-06-20T21:06:13Z
dc.date.available2023-06-20T21:06:13Z
dc.date.issued2002
dc.description© (2003) SPIE--The International Society for Optical Engineering. Annual Boulder Damage Symposium on Optical Materials for High-Power Lasers (34ª. 2002. Boulder, Colorado, EE.UU.) / International Workshop on Laser Beam and Optics Characterization (7º. 2002. Boulder, Colorado, EE.UU.)
dc.description.abstractThe phase space analyzer is an optical device that uses slits, lenses and an irradiance-calibrated image detector in order to characterize optical beams. With such a device it is possible to obtain the beam power distribution along the two-dimensional phase space coordinates corresponding to a given transverse direction. The usual setup includes hard edge slits, and it has been considered in previous studies to measure stigmatic and simple astigmatic beams. We analyze a phase space analyzer with Gaussian slits to measure Gauss Schell-model beams. Special attention is given to general astigmatic beams (such as twisted irradiance and/or twisted phase beams), where a characterization along two orthogonal transverse axes is not enough.
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/21405
dc.identifier.doi10.1117/12.472381
dc.identifier.issn0277-786X
dc.identifier.officialurlhttp://dx.doi.org/10.1117/12.472381
dc.identifier.relatedurlhttp://proceedings.spiedigitallibrary.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/60695
dc.journal.titleLaser-Induced Damage In Optical Materials: 2002 And 7th International Workshop On Laser Beam And Optics Characterization
dc.page.final676
dc.page.initial669
dc.publisherSpie-Int Soc Optical Engineering
dc.rights.accessRightsmetadata only access
dc.subject.cdu535
dc.subject.keywordMaterials Science
dc.subject.keywordCharacterization and Testing
dc.subject.keywordCoatings and Films
dc.subject.keywordOptics
dc.subject.keywordPhysics
dc.subject.keywordCondensed Matter
dc.subject.ucmÓptica (Física)
dc.subject.unesco2209.19 Óptica Física
dc.titleThe phase space analyzer with Gaussian slits
dc.typebook part
dspace.entity.typePublication
relation.isAuthorOfPublication076e3bc6-0918-48a4-a920-6fe13919d721
relation.isAuthorOfPublication.latestForDiscovery076e3bc6-0918-48a4-a920-6fe13919d721

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