The phase space analyzer with Gaussian slits
| dc.book.title | Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop On Laser Beam And Optics Characterization | |
| dc.contributor.author | Serna Galán, Julio | |
| dc.contributor.author | Nemes, George | |
| dc.date.accessioned | 2023-06-20T21:06:13Z | |
| dc.date.available | 2023-06-20T21:06:13Z | |
| dc.date.issued | 2002 | |
| dc.description | © (2003) SPIE--The International Society for Optical Engineering. Annual Boulder Damage Symposium on Optical Materials for High-Power Lasers (34ª. 2002. Boulder, Colorado, EE.UU.) / International Workshop on Laser Beam and Optics Characterization (7º. 2002. Boulder, Colorado, EE.UU.) | |
| dc.description.abstract | The phase space analyzer is an optical device that uses slits, lenses and an irradiance-calibrated image detector in order to characterize optical beams. With such a device it is possible to obtain the beam power distribution along the two-dimensional phase space coordinates corresponding to a given transverse direction. The usual setup includes hard edge slits, and it has been considered in previous studies to measure stigmatic and simple astigmatic beams. We analyze a phase space analyzer with Gaussian slits to measure Gauss Schell-model beams. Special attention is given to general astigmatic beams (such as twisted irradiance and/or twisted phase beams), where a characterization along two orthogonal transverse axes is not enough. | |
| dc.description.department | Depto. de Óptica | |
| dc.description.faculty | Fac. de Ciencias Físicas | |
| dc.description.refereed | TRUE | |
| dc.description.status | pub | |
| dc.eprint.id | https://eprints.ucm.es/id/eprint/21405 | |
| dc.identifier.doi | 10.1117/12.472381 | |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.officialurl | http://dx.doi.org/10.1117/12.472381 | |
| dc.identifier.relatedurl | http://proceedings.spiedigitallibrary.org/ | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14352/60695 | |
| dc.journal.title | Laser-Induced Damage In Optical Materials: 2002 And 7th International Workshop On Laser Beam And Optics Characterization | |
| dc.page.final | 676 | |
| dc.page.initial | 669 | |
| dc.publisher | Spie-Int Soc Optical Engineering | |
| dc.rights.accessRights | metadata only access | |
| dc.subject.cdu | 535 | |
| dc.subject.keyword | Materials Science | |
| dc.subject.keyword | Characterization and Testing | |
| dc.subject.keyword | Coatings and Films | |
| dc.subject.keyword | Optics | |
| dc.subject.keyword | Physics | |
| dc.subject.keyword | Condensed Matter | |
| dc.subject.ucm | Óptica (Física) | |
| dc.subject.unesco | 2209.19 Óptica Física | |
| dc.title | The phase space analyzer with Gaussian slits | |
| dc.type | book part | |
| dspace.entity.type | Publication | |
| relation.isAuthorOfPublication | 076e3bc6-0918-48a4-a920-6fe13919d721 | |
| relation.isAuthorOfPublication.latestForDiscovery | 076e3bc6-0918-48a4-a920-6fe13919d721 |

