Remote electron beam induced current imaging of electrically active regions in YBa_2Cu-3O_(7-x) single crystals
| dc.contributor.author | Díaz-Guerra Viejo, Carlos | |
| dc.contributor.author | Piqueras De Noriega, Francisco Javier | |
| dc.date.accessioned | 2023-06-20T19:02:28Z | |
| dc.date.available | 2023-06-20T19:02:28Z | |
| dc.date.issued | 1997-11-10 | |
| dc.description | © 1997 American Institute of Physics. This work was supported by DGICYT (Project No. PB93-1256) and CICYT (Project No. MAT95-1184E). | |
| dc.description.abstract | Remote electron beam induced current (REBIC) measurements have been carried out to investigate electrically active regions in YBa_2Cu_3O_(7-x) single crystals. Enhanced REBIC contrast, found in growth steps and other topographic features of the samples, is discussed in terms of charged oxygen-related defects. The capability of REBIC to image structural inhomogeneities caused by strain or plastic deformation in these crystals is also established. Charge carrier diffusion length has been estimated at different temperatures from REBIC linescan profiles. | |
| dc.description.department | Depto. de Física de Materiales | |
| dc.description.faculty | Fac. de Ciencias Físicas | |
| dc.description.refereed | TRUE | |
| dc.description.sponsorship | DGICYT | |
| dc.description.sponsorship | CICYT | |
| dc.description.status | pub | |
| dc.eprint.id | https://eprints.ucm.es/id/eprint/26389 | |
| dc.identifier.doi | 10.1063/1.120419 | |
| dc.identifier.issn | 0003-6951 | |
| dc.identifier.officialurl | http://dx.doi.org/10.1063/1.120419 | |
| dc.identifier.relatedurl | http://scitation.aip.org | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14352/59152 | |
| dc.issue.number | 19 | |
| dc.journal.title | Applied Physics Letters | |
| dc.language.iso | eng | |
| dc.page.final | 2832 | |
| dc.page.initial | 2830 | |
| dc.publisher | Amer Inst Physics | |
| dc.relation.projectID | PB93-1256 | |
| dc.relation.projectID | MAT95-1184E | |
| dc.rights.accessRights | open access | |
| dc.subject.cdu | 538.9 | |
| dc.subject.keyword | Superconducting Thin-Films | |
| dc.subject.keyword | Cathodoluminescence Microscopy | |
| dc.subject.keyword | Grain-Boundaries | |
| dc.subject.ucm | Física de materiales | |
| dc.title | Remote electron beam induced current imaging of electrically active regions in YBa_2Cu-3O_(7-x) single crystals | |
| dc.type | journal article | |
| dc.volume.number | 71 | |
| dcterms.references | 1. Y. J. Feng, Q. H. Cheng, P. H. Wu, and H. M. Liu, J. Appl. Phys. 72, 5350 (1992). 2. R. Gross and D. Koelle, Rep. Prog. Phys. 57, 651 (1994) and references therein. 3. P. Gómez, J. Jiménez, P. Martín, J. Piqueras, and F. Domínguez-Adame, J. Appl. Phys. 74, 6289 (1993). 4. P. Gómez, J. Piqueras, M. J. Sayagués, and J. M. Gónzalez-Calbet, Solid State Commun. 96, 45 (1983). 5. C. Díaz-Guerra, J. Piqueras, and C. Opagiste, Physica C 259, 121 (1996). 6. C. Díaz-Guerra and J. Piqueras, J. Appl. Phys. 80, 998 (1996). 7. C. Díaz-Guerra and J. Piqueras, Physica C 275, 37 (1997). 8. D. B. Holt, in SEM Microcharacterization of Semiconductors, edited by D. B. Holt and D. C. Joy (Academic, New York, 1989), pp. 241–338. 9L. O. Bubulac and W. E. Tennant, Appl. Phys. Lett. 52, 1255 (1988). 10. G. Panin and E. Yakimov, Semicond. Sci. Technol. 7, A150 (1992). 11. D. B. Holt, B. Raza, and A. Wojcik, Mater. Sci. Eng. B 42, 14 (1996). 12. E. Ziegler, W. Siegel, H. Blumtritt, and O. Breitenstein, Phys. Status Solidi 72, 593 (1982). 13. G. J. Rusell, M. J. Robertson, B. Vincent, and J. Woods, J. Mater. Sci. 15, 939 (1980). 14. N. Cabrera and R. V. Coleman, in The Art and Science of Growing Crystals, edited by J. J. Gilman (Wiley, New York, 1966). 15. W. K. Kwok, U. Welp, K. G. Vandervoort, Y. Fang, G. W. Crabtree, and J. Z. Liu, Appl. Phys. Lett. 57, 1268 (1990). 16. A. K. Pradhan, B. K. Roul, S. B. Roy, P. Chaddah, D. Kanjilal, C. Chen, and B. M. Wanklyn, Solid State Commun. 101, 367 (1997). 17. P. Gómez, J. Piqueras, A. Remón, J. A. García, J. Jiménez, and A. Torres, Phys. Status Solidi A 157, 469 (1996). 18. J. Palm, J. Appl. Phys. 74, 1169 (1993). 19. M. Iwabuchi, T. Fuji, and T. Kobayashi, Jpn. J. Appl. Phys., Part 2 32, L491 (1993). | |
| dspace.entity.type | Publication | |
| relation.isAuthorOfPublication | b1b44979-3a0d-45d7-aa26-a64b0dbfee18 | |
| relation.isAuthorOfPublication | 68dabfe9-5aec-4207-bf8a-0851f2e37e2c | |
| relation.isAuthorOfPublication.latestForDiscovery | b1b44979-3a0d-45d7-aa26-a64b0dbfee18 |
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