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Water adsorption in porous TiO_2–SiO_2 sol–gel films analyzed by spectroscopic ellipsometry

dc.contributor.authorÁlvarez Herrero, Alberto
dc.contributor.authorRamos Zapata, Gonzalo
dc.contributor.authorMonte Muñoz de la Peña, Francisco del
dc.contributor.authorLevy, David
dc.contributor.authorBernabeu Martínez, Eusebio
dc.date.accessioned2023-06-20T10:46:42Z
dc.date.available2023-06-20T10:46:42Z
dc.date.issued2004-05-01
dc.description© 2004 Elsevier B.V.
dc.description.abstractHigh refractive index TiO_2–SiO_2 thin films were prepared by the sol–gel method and the optical properties were characterized by spectroscopic ellipsometry. The results of the optical analysis were related with the TiO_2–SiO_2 molar ratio of the porous films. It was obtained that the higher is the TiO_2 molar ratio, the higher is the refractive index and the lower is the thickness under the same deposition conditions. In fact, when the TiO_2–SiO_2 molar ratio varies from 70–30% to 100–0%, the refractive index and the thickness vary from ~1.85 to ~1.95 λ=500 nm and from ~65 nm to ~40 nm, respectively. The water adsorption in the pores of the material produces a change in the refractive index of the film. The variation of the optical properties with the environmental relative humidity was also studied. In addition, information about the size and the shape of the pores was extracted from the water adsorption isotherms measured by ellipsometry.
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26751
dc.identifier.doi10.1016/j.tsf.2004.01.023
dc.identifier.issn0040-6090
dc.identifier.officialurlhttp://dx.doi.org/10.1016/j.tsf.2004.01.023
dc.identifier.relatedurlhttp://www.sciencedirect.com
dc.identifier.urihttps://hdl.handle.net/20.500.14352/51204
dc.journal.titleThin Solid Films
dc.language.isoeng
dc.page.final360
dc.page.initial356
dc.publisherElsevier Science SA
dc.rights.accessRightsopen access
dc.subject.cdu535
dc.subject.keywordSurface
dc.subject.ucmÓptica (Física)
dc.subject.unesco2209.19 Óptica Física
dc.titleWater adsorption in porous TiO_2–SiO_2 sol–gel films analyzed by spectroscopic ellipsometry
dc.typejournal article
dc.volume.number455
dcterms.references1. C.J. Brinker, G.W. Scherer, Sol–Gel Science, Academic Press, New York, 1990. 2. A. Morales, A. Durán, J. Sol–gel Sci. Tech. (1997) 451. 3. G.C. Righini, S. Pelli, J. Sol–gel Sci. Tech. (1997) 991. 4. T. Belenguer, P. Cheben, E.M. Moreno, A. Núñez, M. Ulibarrena, F. Del Monte, D. Levy, Opt. Lett. 21 (1996) 1857. 5. F. del Monte, G. Ramos, T. Belenguer, D. Levy, Proc. SPIE 4802 (2002) 51. 6. S.J. Gregg, K.S.W. Sing, Adsorption, Surface Area and Porosity, Academic Press, New York, 1997. 7. G. Ramos, F. Del Monte, M. Zayat, M.L. Ferrer, D. Levy, J. Sol–Gel Sci. Tech. 26 (2003) 869. 8. A. Álvarez-Herrero, H. Guerrero, E. Bernabéu, D. Levy, Appl. Opt. 41 (2002) 6692. 9. A. Álvarez-Herrero, R.L. Heredero, E. Bernabéu, D. Levy, Appl. Opt. 40 (2001) 527.
dspace.entity.typePublication
relation.isAuthorOfPublicatione77a30e7-98fe-421b-8010-077246ffcbdf
relation.isAuthorOfPublication.latestForDiscoverye77a30e7-98fe-421b-8010-077246ffcbdf

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