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In-plane impedance spectroscopy in aerosol deposited NiMn_(2)O_(4) negative temperature coefficient thermistor films

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dc.contributor.authorRyu, Jungho
dc.contributor.authorPark, Dong-Soo
dc.contributor.authorSchmidt, Rainer
dc.date.accessioned2023-06-20T03:56:45Z
dc.date.available2023-06-20T03:56:45Z
dc.date.issued2011-06-01
dc.description© 2011 American Institute of Physics. The authors wish to thank Carlos León and Alberto Rivera for help using the IS equipment, and the Mechanical Workshops at the Facultad de Ciencias Físicas at the Universidad Complutense de Madrid for technical support. J.R. and D.- S.P. were financially supported by a grant from the Fundamental R&D Program for Core Technology of Materials, funded by the Ministry of Knowledge Economy, Republic of Korea. R.S. wishes to acknowledge the Ministerio de Ciencia e Innovación in Spain for granting a Ramón y Cajal Fellowship.
dc.description.abstractTemperature dependent in-plane impedance spectroscopy measurements were carried out in order to analyze the charge transport properties of functional oxide NiMn_(2)O_(4) negative temperature coefficient thermistor films deposited via aerosol deposition techniques onto glass and Al_(2)O_(3) substrates. The in-plane resistivity (ρ) versus temperature (T) curves of all films were uniform over a large temperature range (180 K to 500 K) and showed the typical exponential power-law behavior associated with variable-range hopping. The ρ-T dependences of annealed and as-deposited films exhibited power-law exponents ρ of about 0.6 and thermistor constants B in the range of 3500 K to 5000 K. As-deposited films showed higher ρ values as compared to annealed films. As-deposited films exhibited also increased B values, leading to increased sensitivity of the resistance to temperature changes, whereas annealed films deposited on Al_(2)O_(3) showed the lowest scatter in differentiated ρ-T data and might display superior reliability for temperature sensing applications.
dc.description.departmentDepto. de Estructura de la Materia, Física Térmica y Electrónica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipFundamental R&D Program for Core Technology of Materials, funded by the Ministry of Knowledge Economy, Republic of Korea
dc.description.sponsorshipMinisterio de Ciencia e Innovación (MICINN)
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/32556
dc.identifier.doi10.1063/1.3592300
dc.identifier.issn0021-8979
dc.identifier.officialurlhttp://dx.doi.org/10.1063/1.3592300
dc.identifier.relatedurlhttp://scitation.aip.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/44707
dc.issue.number11
dc.journal.titleJournal of applied physics
dc.language.isoeng
dc.publisherAmerican Institute of Physics
dc.rights.accessRightsopen access
dc.subject.cdu537
dc.subject.keywordNickel manganite
dc.subject.keywordElectrical-properties
dc.subject.keywordCeramic thermistors
dc.subject.keywordNTC thermistors
dc.subject.keywordThin-films
dc.subject.keywordOxide
dc.subject.keywordMicrostructure.
dc.subject.ucmElectricidad
dc.subject.ucmElectrónica (Física)
dc.subject.unesco2202.03 Electricidad
dc.titleIn-plane impedance spectroscopy in aerosol deposited NiMn_(2)O_(4) negative temperature coefficient thermistor films
dc.typejournal article
dc.volume.number109
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