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Study of defects in CdTe: Cl by cathodoluminescence microscopy

dc.contributor.authorPal, U.
dc.contributor.authorFernández Sánchez, Paloma
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.date.accessioned2023-06-20T19:06:58Z
dc.date.available2023-06-20T19:06:58Z
dc.date.issued1995-05
dc.description© 1995 Elsevier Science B.V. UP thanks MEC-DGICYT for a post-doctoral research grant. This work has been supported by DGI-CYT (Project PB-90- 1017). Samples were kindly provided by Japan Energy Corporation.
dc.description.abstractThe effect of Cl doping on the luminescence properties of CdTe is investigated by cathodoluminescence microscopy. Cl enhances the 1.4 eV emission and retards the appearance of the tellurium vacancy related emission band. The behaviour under annealing indicates that doping with substitutional impurities involved in A-centers influences the intensity of the 1.4 eV band.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipDGI-CYT
dc.description.sponsorshipMEC-DGICYT
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26879
dc.identifier.doi10.1016/0167-577X(95)00027-5
dc.identifier.issn0167-577X
dc.identifier.officialurlhttp://dx.doi.org/10.1016/0167-577X(95)00027-5
dc.identifier.relatedurlhttp://www.sciencedirect.com
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59261
dc.issue.number4-jun
dc.journal.titleMaterials Letters
dc.language.isoeng
dc.page.final230
dc.page.initial227
dc.publisherElsevier Science BV
dc.relation.projectIDPB-90-1017
dc.rights.accessRightsopen access
dc.subject.cdu538.9
dc.subject.keywordPhotoluminescence
dc.subject.ucmFísica de materiales
dc.titleStudy of defects in CdTe: Cl by cathodoluminescence microscopy
dc.typejournal article
dc.volume.number23
dcterms.references[1] T.H. Myers, J.F. Schetzina, ST. Edwards and A.F. Schrein, J. Appl. Phys. 54 (1983) 4232. [2] L.O. Bubulac, J. Bajaj, W.E. Termant, P.R. Newman and D.S. Lo, J. Cryst. Growth 86 (1988) 536. [3] H.L. Cotal, A.C. Lewandowski, B.G. Markey, S.W.S. MC Keever, E. Cantrell and J. Aldridge, J. Appl. Phys. 67 (1990) 975. [4] U. Pal, P. Fenández, J. Piqueras, M.D. Serrano and E. Diéguez, Inst. Phys. Conf. Ser. 135 (1994) 177. [5] D.M. Hofman, P. Omling, H.G. Grimmeiss, B.K. Meyer, K.W. Benz and D. Sinerius, Phys. Rev. B 45 (1992) 6247. [6] D.M. Hofmannm, W. Stadler, K. Oettinger, B.K. Meyer, P. Omling, M. Salk, K.W. Benz, E. Wiegel and G. Mtiller-Vogt, Mater. Sci. Eng. B 16 (1993) 128. [7] U. Pal, J. Piqueras, P. Fernández. M.D. Serrano and E. Diéguez, J. Appl. Phys. 76 (1994) 3720. [8] P.A. Slodowy and J.M. Baranowski, Phys. Stat. Sol. 49b (1972) 499. [9] F.J. Bryant and E. Webster, Phys. Stat. Sol. (b) 49b (1972) 499. [1O] F. Domínguez-Adame, J. Piqueras and P. Fenández Appl. Phys. Letters 58 (1991) 257. [11] H.C. Casey and J.S. Jayson, J. Appl. Phys. 42 (1971) 2774. [12] J. Krustock, A. Lou and T. Piibe, J. Phys. Chem. Solids 52 (1991) 1037. [13]1 E. Weigel, G. Miiller-Vogt, B. Steinbach, W. Wendl, W. Stadler, D.M. Hofmann and B.K. Meyer, Mater. Sci. Eng. B 16 (1993) 17.
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relation.isAuthorOfPublication.latestForDiscoverydaf4b879-c4a8-4121-aaff-e6ba47195545

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