On the standard deviation in charge-coupled device cameras: A variogram-based technique for nonuniform images
| dc.contributor.author | Sánchez Brea, Luis Miguel | |
| dc.contributor.author | Bernabeu Martínez, Eusebio | |
| dc.date.accessioned | 2023-06-20T19:04:40Z | |
| dc.date.available | 2023-06-20T19:04:40Z | |
| dc.date.issued | 2002-04 | |
| dc.description | © 2002 SPIE and IS&T. The authors are grateful to Vicente Palanca, from Kinossel S.L., for his support and facilities in this work. | |
| dc.description.abstract | When estimating the standard deviation of a magnitude with spatial dependence, it is necessary to carry out several measurements at every location where the magnitude is estimated. However, in image applications the standard deviation is commonly measured by means of only one high-uniform image. This procedure tends to increase the standard deviation due to spatial nonuniformity of the image. In this work we propose a new technique based on the variogram, which is a function that measures the spatial correlation of the image, that can be employed to accurately estimate the standard deviation of nonuniform images obtained by charge-coupled device cameras. | |
| dc.description.department | Depto. de Óptica | |
| dc.description.faculty | Fac. de Ciencias Físicas | |
| dc.description.refereed | TRUE | |
| dc.description.status | pub | |
| dc.eprint.id | https://eprints.ucm.es/id/eprint/26776 | |
| dc.identifier.doi | 10.1117/1.1427043 | |
| dc.identifier.issn | 1017-9909 | |
| dc.identifier.officialurl | http://dx.doi.org/10.1117/1.1427043 | |
| dc.identifier.relatedurl | http://electronicimaging.spiedigitallibrary.or | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14352/59214 | |
| dc.issue.number | 2 | |
| dc.journal.title | Journal of Electronic Imaging | |
| dc.page.final | 126 | |
| dc.page.initial | 121 | |
| dc.publisher | IS&T- The Society for Imaging Science and Technology | |
| dc.rights.accessRights | metadata only access | |
| dc.subject.cdu | 535 | |
| dc.subject.keyword | Engineering | |
| dc.subject.keyword | Electrical & Electronic | |
| dc.subject.keyword | Optics | |
| dc.subject.keyword | Imaging Science & Photographic Technology | |
| dc.subject.ucm | Óptica (Física) | |
| dc.subject.unesco | 2209.19 Óptica Física | |
| dc.title | On the standard deviation in charge-coupled device cameras: A variogram-based technique for nonuniform images | |
| dc.type | journal article | |
| dc.volume.number | 11 | |
| dcterms.references | 1 .- International Standardization Organization (ISO), Guide to the Expression of the Uncertainty in Measurement , Geneva (1995); the updated Spanish version for this document is “Expresio´n de la Incertidumbre de Medida en las Calibraciones”, Entidad Nacional de Acreditación (ENAC), Spain (1998). 2 .- P. Bevington, Data Reduction and Error Analysis for the Physical Sciences , McGraw-Hill, New York (1969). 3 .- N. A. Cressie, Statistics for Spatial Data , Wiley, New York (1991). 4 .- R. Christiensen, Linear Models for Multivariate, Time Series, and Spatial Data , Springer, Berlin (1985). 5 .- A. G. Journel and Ch. J. Huijbergts, Mining Geostatistics , Academic, New York (1981). 6 .- G. C. Holst, CCD Arrays Cameras and Displays , SPIE, Bellingham, Washington (1996). 7 .- Sánchez-Brea L. M., , Siegmann P. , Rebollo M. A. , and Bernabeu E. , “An optical technique for the detection of surface defects on thin metallic wires. ”,Appl. Opt. . 39, (4 ), 539–545 (2000). | |
| dspace.entity.type | Publication | |
| relation.isAuthorOfPublication | 72f8db7f-8a25-4d15-9162-486b0f884481 | |
| relation.isAuthorOfPublication.latestForDiscovery | 72f8db7f-8a25-4d15-9162-486b0f884481 |