Aviso: para depositar documentos, por favor, inicia sesión e identifícate con tu cuenta de correo institucional de la UCM con el botón MI CUENTA UCM. No emplees la opción AUTENTICACIÓN CON CONTRASEÑA
 

Neutron effects on short circuit currents of op amps and consequences

Simple item page
dc.contributor.authorFranco Peláez, Francisco Javier
dc.contributor.authorZong, Yi
dc.contributor.authorCasas-Cubillos, Juan
dc.contributor.authorRodríguez-Ruiz, Miguel Ángel
dc.contributor.authorAgapito Serrano, Juan Andrés
dc.date.accessioned2023-06-20T10:50:48Z
dc.date.available2023-06-20T10:50:48Z
dc.date.issued2005-10
dc.description© IEEE TNS. This work was supported in part by the cooperation agreement K476/LHC between CERN and UCM, the Spanish research agency CICYT (FPA2002-00912), and ITN.
dc.description.abstractDiscrete bipolar operational amplifiers were irradiated with neutrons in order to study the evolution of the short circuit currents. Also, this paper explores the effect of the reduction of this current in devices based on operational amplifiers.
dc.description.departmentDepto. de Estructura de la Materia, Física Térmica y Electrónica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Educación y Ciencia
dc.description.sponsorshipCERN
dc.description.sponsorshipITN (Portugal)
dc.description.sponsorshipUniversidad Complutense de Madrid
dc.description.sponsorshipCICYT
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/29102
dc.identifier.doi10.1109/TNS.2005.855817
dc.identifier.issn0018-9499
dc.identifier.officialurlhttp://dx.doi.org/10.1109/TNS.2005.855817
dc.identifier.relatedurlhttp://ieeexplore.ieee.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/51328
dc.issue.number5
dc.journal.titleIEEE Transactions on nuclear science
dc.language.isoeng
dc.page.final1537
dc.page.initial1530
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc
dc.relation.projectIDFPA2002-00912
dc.relation.projectIDK476/LHC
dc.rights.accessRightsopen access
dc.subject.cdu537.8
dc.subject.keywordNeutron effects
dc.subject.keywordOperational amplifiers
dc.subject.keywordShort-circuit currents
dc.subject.keywordCOTS
dc.subject.keywordOp Amps
dc.subject.keywordDiscrete bipolar operational amplifiers
dc.subject.keyworddisplacement damage
dc.subject.keywordneutron effects
dc.subject.keywordradiation tolerance
dc.subject.keywordshort circuit currents
dc.subject.keywordCryogenics
dc.subject.keywordInstruments
dc.subject.keywordLarge Hadron Collider
dc.subject.keywordNeutrons
dc.subject.keywordNuclear electronics
dc.subject.keywordResistors
dc.subject.keywordShort circuit currents
dc.subject.keywordSpace technology
dc.subject.keywordVoltage
dc.subject.keywordBipolar operational amplifiers
dc.subject.ucmElectrónica (Física)
dc.subject.ucmRadiactividad
dc.titleNeutron effects on short circuit currents of op amps and consequences
dc.typejournal article
dc.volume.number52
dcterms.references[1] P. R. Gray and R. G. Meyer, Analysis and Design of Analog Integrated Circuits, 1993 :Wiley [2] D. Smith, M. Koen, and A. F. Witulsky, "Evolution of high speed operational amplifier architectures", IEEE J. Solid-State Circuits, vol. 29, no. 10, pp.1166 -1179 1994 [3] E. Greeneich, Analog Integrated Circuits, 1997 :Chapman &amp, Hall [4] J. Marques, A. C. Fernandes, I. C. Gonçalves, and A. J. G. Ramalho, "Test facility at the portuguese research reactor for irradiation with fast neutrons", Radiation Effects on Components and Systems Workshop, 2004 [5] J. G. Marques, Director of Portuguese Research Reactor, [6] ATLAS Standard Radiation Test Methods, Appendix 2, [online] Available: http://atlas.web.cern.ch/Atlas/GROUPS/FRONTEND/radhard.htm [7] G. C. Messenger, "A summary review of displacement damage from high energy radiation in silicon semiconductors and semiconductor devices", IEEE Trans. Nucl. Sci., vol. 39, no. 3, pp.468 -473 1992 [8] G. Messenger and M. Ash, The Effects of Radiation on Electronic Systems, 1992 :Van Nostrand Reinhold [9] S. M. Sze, Physics of Semiconductor Devices, 1981 :Wiley [10] P. Horowitz and W. Hill, The Art of Electronics, 1990 [11] L. Bonora and J. P. David, "An attempt to define conservative conditions for total dose evaluation of bipolar ICs", IEEE Trans. Nucl. Sci., vol. 44, no. 6, pp.1974 -1980 1997 [12] A. J. Peyton and V. Walsh, Analog Electronics With Op Amps. A Source Book of Practical Circuits, 1993 [13] J. A. Agapito, et al., "Radiation test on commercial instrumentation amplifiers, analog switches &, DAC',s", Proc. 7th Workshop for LHC Experiments, pp.113 -118 2001 [14] J. A. Agapito, "Instrumentation amplifiers and voltage controlled current sources for LHC cryogenic system", Proc. 6th Workshop for LHC Experiments, pp.275 -280 2000 [15] B. G. Rax, C. I. Lee, and A. H. Johnston, "Degradation of precision reference devices in space environments", IEEE Trans. Nucl. Sci., vol. 44, no. 6, pp. 1939 -1944, 1997
dspace.entity.typePublication
relation.isAuthorOfPublication662ba05f-c2fc-4ad7-9203-36924c80791a
relation.isAuthorOfPublication.latestForDiscovery662ba05f-c2fc-4ad7-9203-36924c80791a

Download

Original bundle

Now showing 1 - 1 of 1
Thumbnail Image
Name:
TNS2004-Franco-UCM.pdf
Size:
629.63 KB
Format:
Adobe Portable Document Format
downoload Download

Collections

Artículos