Field emission properties of gallium oxide micro- and nanostructures in the scanning electron microscope
| dc.contributor.author | López, Iñaki | |
| dc.contributor.author | Nogales Díaz, Emilio | |
| dc.contributor.author | Hidalgo Alcalde, Pedro | |
| dc.contributor.author | Méndez Martín, María Bianchi | |
| dc.contributor.author | Piqueras De Noriega, Francisco Javier | |
| dc.date.accessioned | 2023-06-20T03:37:31Z | |
| dc.date.available | 2023-06-20T03:37:31Z | |
| dc.date.issued | 2012-01 | |
| dc.description | © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. This work has been supported by MICINN (Projects MAT 2009-07882 and Consolider Ingenio CSD 2009-00013) and by BSCH-UCM (Project GR35-10A-910146). The authors are grateful to Dr Luca Gregoratti at the Sincrotrone Trieste for useful advises on XPS measurements. | |
| dc.description.abstract | The field emission properties of gallium oxide nanowires grown by thermal evaporation-deposition have been investigated inside the chamber of a scanning electron microscope. Turn on electric fields and enhancement factors have been determined for Sn doped nanowires. X-ray photoelectron spectroscopy measurements have been performed to calculate the work function of Sn doped Ga2O3. The results show improved field emission properties of Sn doped Ga2O3 nanowires, with a lower threshold field (below 1.0 V/mu m). The obtained values are competitive with those achieved in other nanostructured materials, including carbon nanotubes. | |
| dc.description.department | Depto. de Física de Materiales | |
| dc.description.faculty | Fac. de Ciencias Físicas | |
| dc.description.refereed | TRUE | |
| dc.description.sponsorship | MICINN | |
| dc.description.sponsorship | BSCH-UCM | |
| dc.description.status | pub | |
| dc.eprint.id | https://eprints.ucm.es/id/eprint/24194 | |
| dc.identifier.doi | 10.1002/pssa.201127406 | |
| dc.identifier.issn | 1862-6300 | |
| dc.identifier.officialurl | http://onlinelibrary.wiley.com/doi/10.1002/pssa.201127406/full | |
| dc.identifier.relatedurl | http://onlinelibrary.wiley.com | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14352/44078 | |
| dc.issue.number | 1 | |
| dc.journal.title | Physica Status Solidi A-Applications and Materials Science | |
| dc.language.iso | eng | |
| dc.page.final | 117 | |
| dc.page.initial | 113 | |
| dc.publisher | Wiley-V C H Verlag GMBH | |
| dc.relation.projectID | MAT 2009-07882 | |
| dc.relation.projectID | Consolider Ingenio CSD 2009-00013 | |
| dc.relation.projectID | GR35-10A-910146 | |
| dc.rights.accessRights | open access | |
| dc.subject.cdu | 538.9 | |
| dc.subject.keyword | Ga2o3 Nanowires | |
| dc.subject.keyword | Thin-Films | |
| dc.subject.keyword | Beta-Ga2o3 | |
| dc.subject.keyword | Growth | |
| dc.subject.ucm | Física de materiales | |
| dc.title | Field emission properties of gallium oxide micro- and nanostructures in the scanning electron microscope | |
| dc.type | journal article | |
| dc.volume.number | 209 | |
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| dspace.entity.type | Publication | |
| relation.isAuthorOfPublication | f65096c2-6796-43bf-a661-9e2079b73d1c | |
| relation.isAuthorOfPublication | c834e5a4-3450-4ff7-8ca1-663a43f050bb | |
| relation.isAuthorOfPublication | 465cfd5b-6dd4-4a48-a6e3-160df06f7046 | |
| relation.isAuthorOfPublication | 68dabfe9-5aec-4207-bf8a-0851f2e37e2c | |
| relation.isAuthorOfPublication.latestForDiscovery | f65096c2-6796-43bf-a661-9e2079b73d1c |
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