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Characterization of FDTD artifacts and modes in photonic crystals

dc.contributor.authorLópez Alonso, José Manuel
dc.contributor.authorRico García, José María
dc.contributor.authorAlda Serrano, Javier
dc.date.accessioned2023-06-20T11:03:36Z
dc.date.available2023-06-20T11:03:36Z
dc.date.copyrightCopyright 2004 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
dc.date.issued2004-11-30
dc.descriptionProoceedings of SPIE 5618: Conference on Integrated Optical Devices, Nanostructures, and Displays, 39 (ISBN: 0-8194-5571-7)
dc.description.abstractFDTD algorithms are being used as a numeric tool for the analysis of photonic crystals. The definition of the modes associated with them is of interest for the study of the capabilities of photonic crystal devices. The Principal Component Analysis (PCA) has been applied here to a sequence of images corresponding to the electromagnetic fields obtained from the FDTD simulations. PCA has revealed and quantified the importance of the modes appearing in the photonic crystals. The capability of PCA to produce spatial structures, or maps, associated with temporal evolutions has made possible the calculation of the modulus and phase of the modes existing in the photonic crystal. Some other modes, contributing with an almost negligible amount to the total variance of the original data, are also revealed by the method. Besides, PCA has been used to quantify the contribution of the numerical noise of the algorithm and to identify the effect of artifacts related with the matching of the computational grid and the inner geometry of the photonic crystal.en
dc.description.departmentDepto. de Optometría y Visión
dc.description.facultyFac. de Óptica y Optometría
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Ciencia, Innovación y Universidades (España)
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/34527
dc.identifier.citationLópez Alonso, J. M., Rico García, J. M., Alda Serrano, J. «Characterization of FDTD artifacts and modes in photonic crystals». Integrated Optical Devices, Nanostructures, and Displays, vol. 5618, SPIE, 2004, pp. 39-47. www.spiedigitallibrary.org, https://doi.org/10.1117/12.578948.
dc.identifier.doi10.1117/12.578948
dc.identifier.isbn0-8194-5571-7
dc.identifier.issn0277-786X
dc.identifier.officialurlhttp://dx.doi.org/10.1117/12.578948
dc.identifier.relatedurlhttp://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=853050
dc.identifier.urihttps://hdl.handle.net/20.500.14352/51659
dc.journal.titleProceedings of SPIE
dc.language.isoeng
dc.page.final47
dc.page.initial39
dc.publisherSPIE
dc.relation.projectIDTIC2001-1259
dc.rights.accessRightsopen access
dc.subject.cdu621.38
dc.subject.cdu537.533.3
dc.subject.keywordIntegrated optical devices
dc.subject.keywordNanostructures photonic devices
dc.subject.keywordFDTD algorithms
dc.subject.ucmFísica de materiales
dc.subject.ucmÓptica (Física)
dc.subject.ucmOptoelectrónica
dc.subject.unesco2209.19 Óptica Física
dc.titleCharacterization of FDTD artifacts and modes in photonic crystalsen
dc.typejournal article
dc.volume.number5618
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscoveryf83d6ebf-28e1-4568-ac27-e4db5acfc6dd

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