Aviso: para depositar documentos, por favor, inicia sesión e identifícate con tu cuenta de correo institucional de la UCM con el botón MI CUENTA UCM. No emplees la opción AUTENTICACIÓN CON CONTRASEÑA
 

Structural, electrical, and optical properties of CuGaSe2 rf sputtered thin films

dc.contributor.authorMartil De La Plaza, Ignacio
dc.contributor.authorGonzález Díaz, Germán
dc.contributor.authorSánchez Quesada, Francisco
dc.contributor.authorSantamaría Sánchez-Barriga, Jacobo
dc.date.accessioned2023-06-20T19:08:57Z
dc.date.available2023-06-20T19:08:57Z
dc.date.issued1990-06-01
dc.description© American Institute of Physcis. The authors would like to express their acknowledgment to J. Carabe (Instituto de Energías Renovables, C.I.E.M.A.T.) for optical measurements facilities and J.M. Gómez de Salazar (Departamento de Metalurgia, U.C.M.) for S.E.M. observations and EDAX analysis. This work was partially supported by the U.S.-Spain Joint Committee for Science and Technology under Grant No. CCA-84111046.
dc.description.abstractThin films of CuGaSe2 have been produced by rf sputtering. Compositional, structural, electrical, and optical properties are strongly influenced by growthtemperature. At substrate temperatures lower than 300 °C amorphous or poorly crystalline Se‐excess films are obtained, showing high resistivity (≊103 Ω cm) and optical transitions at 1.62, 1.80, and 2.4 eV (values lower than the single‐crystal counterparts). At the higher growthtemperatures,polycrystalline films are obtained (average grain size 0.7 μm) with lower values of resistivity (1 Ω cm), and optical transitions at 1.68, 1.90, and 2.55 eV (very close to the single‐crystal values). A hopping conduction mechanism has been detected at the lower measuringtemperature (T<150 K), and a grain boundary limited conduction process at the higher measurementstemperature (T>150 K). Structural and compositional characteristics are used to explain the behavior observed in the electrical and optical properties.
dc.description.departmentDepto. de Estructura de la Materia, Física Térmica y Electrónica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipU.S.-Spain Joint Committee for Science and Technology
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/27150
dc.identifier.doi10.1063/1.347113
dc.identifier.issn0021-8979
dc.identifier.officialurlhttp://dx.doi.org/10.1063/1.347113
dc.identifier.relatedurlhttp://scitation.aip.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59314
dc.issue.number1
dc.journal.titleJournal of Applied Physics
dc.language.isoeng
dc.page.final194
dc.page.initial189
dc.publisherAmerican Institute of Physics
dc.relation.projectIDCCA-84111046
dc.rights.accessRightsopen access
dc.subject.cdu537
dc.subject.keywordPhysics
dc.subject.keywordApplied.
dc.subject.ucmElectricidad
dc.subject.ucmElectrónica (Física)
dc.subject.unesco2202.03 Electricidad
dc.titleStructural, electrical, and optical properties of CuGaSe2 rf sputtered thin films
dc.typejournal article
dc.volume.number68
dcterms.references1) W.H. Bloss, J. Kimmerle, F. Pfisterer and H.W. Schock, in Proceedings of the 17th IEEE Photovoltaic Specialists Conference, Kissimmee, FL, 1984 (IEEE, New York, 1984), p. 715. 2) K.R. Murali, B.S.V. Gopalam and J. Sobhandri, J. Mater. Sci. Lett., 5, 421 (1986). 3) R. Noufi, R. Powell, C. Herrington and T. Coutts, Solar Cells, 17, 303 (1986). 4) J.L. Annapurna and K.V. Reddy, Indian J. Pure Appl. Phys., 24, 283 (1986). 5) Y.K. Kapur, B.M. Basol and E.S. Tseng, in Proceedings of the 18th IEEE Photovoltaic Specialists Conference, Las Vegas, NV, 1985 (IEEE, New York, 1986), p. 1429. 6) W. Arnat, B. Dimmler, H. Dirttrich, J. Kimerle, R. Menner, F. Pfisterer and H.W. Schock, in Proceedings of the 18th IEEE Photovoltaix Specialists Conference, Las Vegasa, NV, Octuber 1985 (IEEE, New York, 1986. 7) W. Horig, H. Neumann, B. Schumann and G. Kuhn, Phys. Status Solidi B, 85, K57 (1978). 8) I. Mártil, G. González-Díaz, J. Santamaría, M.L. Lucía, J.L. Hernández-Rojas and F. Sánchez-Quesada, J. Mater. Sci. Lett., (in press). 9) I. Mártil, G. González-Díaz and F. Sánchez-Quesada, Thin Solid Films, 114, 327 (1984). 10) I. Mártil, G. González-Díaz and F. Sánchez-Quesada, Solar Energy Mater., 12, 345 (1985). 11) ASTM Cards Numbers: 31-456 and 29-628. 12) W. Arndt, H. Dittrich and H.W. Schock, Thin Solid Films, 130, 209 (1985). 13) J.Y.W. Seto, J. Appl. Phys., 46, 5247 (1975). 14) J.W. Orton and H.J. Powell, Rep. Prog. Phys., 43, 1263 (1980). 15) G. Masse, J. Phys. Chem. Solids, 45, 1091 (1984). 16) L. Mandel, Solid State Commum., 32, 201 (1979). 17) M.H. Brodsky, ed., Amorphous Semiconductors, Vol. 36 of Topics in Applied Physics (Springer, Berlin, 1979). 18) J.J. Hauser, Phys. Rev. Lett., 29, 476 (1979). 19) R.P. Sharma, A.K. Shukla, A.K. Kapoor, R. Srivastava and P.C. Mathur, J. Appl. Phys., 57, 2026 (1985). 20) G.D. Boyd, H.M. Kasper, J.H. McFee and F.G. Storz, IEEE J. Quantum Electron., QE-8, 900 (1972). 21) I. Mártil, G. González-Díaz, F. Sánchez-Quesada and M. Rodríguez-Vidal, Thin Solid Films, 120, 31 (1984). 22) J.L. Shay, B. Tell, H.M. Kasper and L.M. Schiavone, Phys. Rev. B, 5, 5003 (1972). 23) J. Tuttle, D. Albin, J. Goral, C. Kennedy and R. Noufi, Solar Cells, 24, 67 (1988). 24) D. Albin, R. Noufi, J. Tuttle, J. Goral and S.H. Risbud, J. Appl. Phys., 64, 4103 (1988). 25) J. Santamaría, I. Mártil, E. Iborra, G. González-Díaz and F. Sánchez-Quesada, J. Vac. Sci. Technol. A, 7, 1424 (1989).
dspace.entity.typePublication
relation.isAuthorOfPublication6db57595-2258-46f1-9cff-ed8287511c84
relation.isAuthorOfPublicationa5ab602d-705f-4080-b4eb-53772168a203
relation.isAuthorOfPublicatione10ef3c8-ce81-45ae-b2cc-8cc0326e23a1
relation.isAuthorOfPublication75fafcfc-6c46-44ea-b87a-52152436d1f7
relation.isAuthorOfPublication.latestForDiscoverya5ab602d-705f-4080-b4eb-53772168a203

Download

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Martil,122libre.pdf
Size:
912.06 KB
Format:
Adobe Portable Document Format

Collections