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Scanning electron acoustic microscopy observations of twins and grain boundaries in III‐V materials

dc.contributor.authorDomínguez-Adame Acosta, Francisco
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.date.accessioned2023-06-20T19:08:30Z
dc.date.available2023-06-20T19:08:30Z
dc.date.issued1989-09-15
dc.description© American Institute of Physics. This work has been supported by the Volkswagen Foundation and by the Comisión Intermiisterial de Ciencia y Tecnología (Project No. PB86-0151).
dc.description.abstractPolycrystalline GaP and InP have been observed by scanning electron acoustic microscopy. While grain boundaries show a weak contrast, twinned regions are clearly revealed. Results suggest that the contrast observed is related to signal generation by a piezoelectric‐coupling mechanism
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipVolkswagon Foundation
dc.description.sponsorshipComision Interministerial de Ciencia y Tecnología
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/27081
dc.identifier.doi10.1063/1.344198
dc.identifier.issn0021-8979
dc.identifier.officialurlhttp://dx.doi.org/10.1063/1.344198
dc.identifier.relatedurlhttp://scitation.aip.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59303
dc.issue.number6
dc.journal.titleJournal of Applied Physics
dc.language.isoeng
dc.page.final2753
dc.page.initial2751
dc.publisherAmerican Institute of Physics
dc.relation.projectIDPB86-0151
dc.rights.accessRightsopen access
dc.subject.cdu538.9
dc.subject.keywordPhysics
dc.subject.keywordApplied
dc.subject.ucmFísica de materiales
dc.titleScanning electron acoustic microscopy observations of twins and grain boundaries in III‐V materials
dc.typejournal article
dc.volume.number66
dcterms.references1. C. Murphy, J. W. Maclachlan, and I. C. Aamodt, IEEE Trans. Ultrason Ferroelect. Freq. Control UFFC-33, 529 (1986). 2. L. J. Balk and N. Kultscher, J. Phys. 45, 869 (1984). 3. D. G. Davies, Philos Trans R. Soc. Lond. Ser. A 320, 243 (1980). 4. M. Urchulutegui, J. Piqueras, and J. Llopis, J. Appl. Phys. 65, 2677 (1989). 5. L. Hershenson and Zanio, J. Appl. Phys. 51, 3663 (1980). 6. J. Opsal and A. Roosenewaig, J. Appl. Phy. 53, 4240 (1982). 7. N. kultscher and I. J. Balk , Scanning Electron Microsc I, 33 (1986). 8. L. J. Balk, D. G. Davies, and N. Kultscher, Phys Status solidi A 82.23 (1984). 9. M. Booyens; J. S. Vermaak, and G. R. Proto, J. Appl. Phys. 48, 3008 (1977).
dspace.entity.typePublication
relation.isAuthorOfPublicationdbc02e39-958d-4885-acfb-131220e221ba
relation.isAuthorOfPublication68dabfe9-5aec-4207-bf8a-0851f2e37e2c
relation.isAuthorOfPublication.latestForDiscoverydbc02e39-958d-4885-acfb-131220e221ba

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