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Design and development of a profilometer for the fast and accurate characterization of optical surfaces

dc.book.titleOptical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
dc.contributor.authorGómez Pedrero, José Antonio
dc.contributor.authorRodríguez Ibáñez, Diego
dc.contributor.authorAlonso Fernández, José
dc.contributor.authorQuiroga Mellado, Juan Antonio
dc.contributor.editorDuparré, Angela
dc.contributor.editorGeyl, Roland
dc.date.accessioned2023-06-19T15:55:17Z
dc.date.available2023-06-19T15:55:17Z
dc.date.issued2015
dc.description© 2015 SPIE-International Society of Optical Engineering. Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology (5ª. 2015. Jena (Alemania). The authors wish to thank the financial support of this work given by the Spanish Ministerio de Economía y Competitividad through the grant DPI2012-36103.
dc.description.abstractWith the advent of techniques devised for the mass production of optical components made with surfaces of arbitrary form (also known as free form surfaces) in the last years, a parallel development of measuring systems adapted for these new kind of surfaces constitutes a real necessity for the industry. Profilometry is one of the preferred methods for the assessment of the quality of a surface, and is widely employed in the optical fabrication industry for the quality control of its products. In this work, we present the design, development and assembly of a new profilometer with five axis of movement, specifically suited to the measurement of medium size (up to 150 mm of diameter) "free-form" optical surfaces with sub-micrometer accuracy and low measuring times. The apparatus is formed by three X, Y, Z linear motorized positioners plus and additional angular and a tilt positioner employed to locate accurately the surface to be measured and the probe which can be a mechanical or an optical one, being optical one a confocal sensor based on chromatic aberration. Both optical and mechanical probes guarantee an accuracy lower than the micrometer in the determination of the surface height, thus ensuring an accuracy in the surface curvatures of the order of 0.01 D or better. An original calibration procedure based on the measurement of a precision sphere has been developed in order to correct the perpendicularity error between the axes of the linear positioners. To reduce the measuring time of the profilometer, a custom electronics, based on an Arduino (TM) controller, have been designed and produced in order to synchronize the five motorized positioners and the optical and mechanical probes so that a medium size surface (around 10 cm of diameter) with a dynamic range in curvatures of around 10 D, can be measured in less than 300 seconds (using three axes) keeping the resolution in height and curvature in the figures mentioned above.
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Economía y Competitividad (MINECO), España
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/35652
dc.identifier.doi10.1117/12.2191058
dc.identifier.isbn978-1-62841-817-0
dc.identifier.officialurlhttp://dx.doi.org/10.1117/12.2191058
dc.identifier.relatedurlhttp://proceedings.spiedigitallibrary.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/35812
dc.issue.number9628
dc.language.isoeng
dc.publisherSPIE-International Society of Optical Engineering
dc.relation.ispartofseriesProceedings of the SPIE
dc.relation.projectIDDPI2012-36103
dc.rights.accessRightsopen access
dc.subject.cdu535
dc.subject.keywordProfilometry
dc.subject.keywordOptical surfaces
dc.subject.keywordAccuracy
dc.subject.keywordFree-form optics
dc.subject.ucmÓptica (Física)
dc.subject.unesco2209.19 Óptica Física
dc.titleDesign and development of a profilometer for the fast and accurate characterization of optical surfaces
dc.typebook part
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