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Use of light for the electrochemical deposition of Bi on n-GaAs substrates

dc.contributor.authorPrados Díaz, Alicia
dc.contributor.authorRanchal Sánchez, Rocío
dc.date.accessioned2023-06-17T13:29:53Z
dc.date.available2023-06-17T13:29:53Z
dc.date.issued2019-09-01
dc.description©2019 Elsevier Ltd. All rights reserved This work has been financially supported through projects MAT2015-66888-C3-3-R (MINECO/FEDER) and RTI2018-097895-B-C43 of the Spanish Ministry of Economy and Competitiveness. We would like to acknowledge the postdoctoral fellowship granted by Consejeria de Educacion, Juventud y Deporte de la Comunidad de Madrid and the European Social Fund (grant PEJD-2016/IND-2233 of the YEI program). We also acknowledge the use of facilities of Instituto de Sistemas Optoelectronicos y Microtecnologia (ISOM).
dc.description.abstractIn this work, we have explored the possibility of using light to remove the adsorbed hydrogen layer that blocks the GaAs surface when electrodepositing Bi thin films on lower-doped n-GaAs(111)B substrates. A light pulse of a few seconds applied under open-circuit (zero-current) conditions before starting the electrodepositionof Bi in darkness has a small effect on the structural, morphological and interfacial electrical properties of the Bi film in comparison to layers deposited without the use of light. The potentiostatic curves recorded during the Bi nucleation show that the light pulse does not remove the adsorbed hydrogen layer but modifies the n-GaAs surface, inhibiting the reduction of Bi(III) ions. The atomic force microscopy analysis of the n-GaAs surface corroborates that the light degrades the surface by inducing photo-oxidation reactions, phenomenon that is correlated to the photocorrosion of the substrate. To maintain the electrical neutrality during photocorrosion, proton reduction and electroless deposition of Bi occur in parallel to the photo-oxidations. The simultaneity of these processes and the inhibition of Bi(III) ions to get reduced on those areas of the n-GaAs surface chemically altered enables the electroless deposition of unconnected Bi flakes with morphological, structural and interfacial electrical properties close to the state of the art of Bi thin films. Only the out of plane crystal quality of the Bi flakes show a small detriment whereas the Schottky barrier height slightly increases.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Economía y Competitividad (MINECO)/FEDER
dc.description.sponsorshipMinisterio de Economía y Competitividad (MINECO)
dc.description.sponsorshipComunidad de Madrid/YEI
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/57158
dc.identifier.doi10.1016/j.electacta.2019.05.085
dc.identifier.issn0013-4686
dc.identifier.officialurlhttp://dx.doi.org/10.1016/j.electacta.2019.05.085
dc.identifier.relatedurlhttps://www.sciencedirect.com
dc.identifier.urihttps://hdl.handle.net/20.500.14352/13626
dc.journal.titleElectrochimica acta
dc.language.isoeng
dc.page.final124
dc.page.initial113
dc.publisherPergamon - Elsevier Science
dc.relation.projectIDMAT2015-66888-C3-3-R
dc.relation.projectIDRTI2018-097895-B-C43
dc.relation.projectIDPEJD-2016/IND-2233
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España
dc.rights.accessRightsopen access
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subject.cdu538.9
dc.subject.keywordElectrolyte junctions
dc.subject.keywordCurrent transport
dc.subject.keywordSteady-state
dc.subject.keywordSurface
dc.subject.keywordNucleation
dc.subject.keywordMechanism
dc.subject.keywordKinetics
dc.subject.keywordElectrodeposition
dc.subject.keywordGrowth
dc.subject.keywordEvolution
dc.subject.keywordBismuth
dc.subject.keywordn-GaAs
dc.subject.keywordElectroless
dc.subject.keywordThermionic emission
dc.subject.ucmFísica de materiales
dc.subject.ucmFísica del estado sólido
dc.subject.unesco2211 Física del Estado Sólido
dc.titleUse of light for the electrochemical deposition of Bi on n-GaAs substrates
dc.typejournal article
dc.volume.number316
dspace.entity.typePublication
relation.isAuthorOfPublicationeca2c0e4-9357-4a13-a15b-35493ec315af
relation.isAuthorOfPublication.latestForDiscoveryeca2c0e4-9357-4a13-a15b-35493ec315af

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