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Supervisory circuits in a mixed neutron and gamma radiation environment

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dc.conference.date11/07/2005-15/07/2005
dc.conference.placeSeattle (USA)
dc.conference.titleRadiation Effects Data Workshop, 2005. IEEE
dc.contributor.authorZong, Yi
dc.contributor.authorFranco Peláez, Francisco Javier
dc.contributor.authorHernández Cachero, Antonio
dc.contributor.authorAgapito Serrano, Juan Andrés
dc.contributor.authorFernandes, Ana C.
dc.contributor.authorMarques, José G.
dc.contributor.authorRodríguez-Ruiz, Miguel Ángel
dc.contributor.authorCasas-Cubillos, Juan
dc.date.accessioned2023-06-20T14:17:16Z
dc.date.available2023-06-20T14:17:16Z
dc.date.issued2005-07-11
dc.description© Copyright IEEE DOI: 10.1109/REDW.2005.1532679 ISBN: 0-7803-9367-8
dc.description.abstractThis paper describes the evolution of different commercial microprocessor supervisory circuits under neutron and gamma radiation. After the irradiation, the tested devices showed some interesting changes: an increase of supply current and the period of watchdog timer. It was also observed that threshold voltage hysteresis and the shift of TTL trigger level appeared in some devices.
dc.description.departmentDepto. de Estructura de la Materia, Física Térmica y Electrónica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Educación y Ciencia
dc.description.sponsorshipCERN
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/28905
dc.identifier.officialurlhttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1532679
dc.identifier.urihttps://hdl.handle.net/20.500.14352/53994
dc.language.isoeng
dc.page.final137
dc.page.initial132
dc.relation.projectIDFPA2002-00912
dc.relation.projectIDK476/LHC
dc.rights.accessRightsopen access
dc.subject.cdu537.8
dc.subject.keywordGamma-ray effects
dc.subject.keywordHysteresis
dc.subject.keywordIntegrated circuit testing
dc.subject.keywordMicroprocessor chips
dc.subject.keywordNeutron effects
dc.subject.keywordReference circuits
dc.subject.keywordTTL trigger level shift
dc.subject.keywordMicroprocessor supervisory circuits
dc.subject.keywordMixed neutron-gamma radiation environment
dc.subject.keywordSupply current increase
dc.subject.keywordThreshold voltage hysteresis
dc.subject.keywordWatchdog timer
dc.subject.keywordCircuit testing
dc.subject.keywordClocks
dc.subject.keywordCryogenics
dc.subject.keywordField programmable gate arrays
dc.subject.keywordGamma rays
dc.subject.keywordInductors
dc.subject.keywordLarge Hadron Collider
dc.subject.keywordMicroprocessors
dc.subject.keywordNeutrons
dc.subject.keywordThreshold voltage
dc.subject.ucmElectrónica (Física)
dc.subject.ucmRadiactividad
dc.subject.ucmElectrónica (Informática)
dc.subject.unesco2203 Electrónica
dc.titleSupervisory circuits in a mixed neutron and gamma radiation environment
dc.typeconference poster
dspace.entity.typePublication
relation.isAuthorOfPublication662ba05f-c2fc-4ad7-9203-36924c80791a
relation.isAuthorOfPublication61e3c731-f799-4eee-b4c2-7e5ad8b417c2
relation.isAuthorOfPublication.latestForDiscovery662ba05f-c2fc-4ad7-9203-36924c80791a

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