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Cathodoluminescence from nanocrystals in mechanically milled silicon

dc.contributor.authorDíaz-Guerra Viejo, Carlos
dc.contributor.authorMontone, A.
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorCardellini, F.
dc.date.accessioned2023-06-20T19:01:57Z
dc.date.available2023-06-20T19:01:57Z
dc.date.issued2000
dc.description© scientific.net. International Workshop on Bean Injection Assessment of Microstructures in Semiconductors (6. 2000. Fukuoka, Japón).
dc.description.abstractMechanical milling is a technique extensively used to prepare nanocrystalline metallic materials but it has been less frequently applied to semiconductors. The preparation of nanocrystalline silicon by different methods is a subject of increasing interest due to the luminescent properties of this material and its possible application in optoelectronic devices. In this work high-energy ball milling has been used to prepare nanocrystals from single crystalline silicon wafers. The structure of the milled samples has been assessed by X-ray diffraction, transmission electron microscopy (TEM) and Raman spectroscopy, while their luminescence has been investigated by cathodoluminescence (CL) in the scanning electron microscope (SEM). The samples consist of a powder of particles with sizes of hundreds of nanometers aggregated to form bigger particles of several microns. TEM reveals that the particles consist of nanocrystals with a wide range of sizes including crystallites with dimension of few nanometers. CL spectra of the milled samples show a band at 1.61 eV, attributed to the presence of nanocrystals through a quantum confinement effect. It is suggested that a milling induced infrared emission is related to a high density of extended defects present in the milled samples.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26363
dc.identifier.issn1012-0394
dc.identifier.officialurlhttp://dx.doi.org/10.4028/www.scientific.net/SSP.78-79.103
dc.identifier.relatedurlhttp://www.scientific.net
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59137
dc.journal.titleBeam Injection Assessment of Microestructures in Semiconductors, 20
dc.page.final109
dc.page.initial103
dc.publisherTrans Tech Publications Ltd
dc.rights.accessRightsmetadata only access
dc.subject.cdu538.9
dc.subject.keywordOxidized Porous Silicon
dc.subject.keywordVisible Photoluminescence
dc.subject.keywordLuminescence Properties
dc.subject.keywordOptical-Properties
dc.subject.keywordSi
dc.subject.keywordFilms
dc.subject.keywordStates
dc.subject.ucmFísica de materiales
dc.titleCathodoluminescence from nanocrystals in mechanically milled silicon
dc.typejournal article
dc.volume.number78-79
dspace.entity.typePublication
relation.isAuthorOfPublicationb1b44979-3a0d-45d7-aa26-a64b0dbfee18
relation.isAuthorOfPublication68dabfe9-5aec-4207-bf8a-0851f2e37e2c
relation.isAuthorOfPublication.latestForDiscoveryb1b44979-3a0d-45d7-aa26-a64b0dbfee18

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