Cathodoluminescence from nanocrystals in mechanically milled silicon
dc.contributor.author | Díaz-Guerra Viejo, Carlos | |
dc.contributor.author | Montone, A. | |
dc.contributor.author | Piqueras De Noriega, Francisco Javier | |
dc.contributor.author | Cardellini, F. | |
dc.date.accessioned | 2023-06-20T19:01:57Z | |
dc.date.available | 2023-06-20T19:01:57Z | |
dc.date.issued | 2000 | |
dc.description | © scientific.net. International Workshop on Bean Injection Assessment of Microstructures in Semiconductors (6. 2000. Fukuoka, Japón). | |
dc.description.abstract | Mechanical milling is a technique extensively used to prepare nanocrystalline metallic materials but it has been less frequently applied to semiconductors. The preparation of nanocrystalline silicon by different methods is a subject of increasing interest due to the luminescent properties of this material and its possible application in optoelectronic devices. In this work high-energy ball milling has been used to prepare nanocrystals from single crystalline silicon wafers. The structure of the milled samples has been assessed by X-ray diffraction, transmission electron microscopy (TEM) and Raman spectroscopy, while their luminescence has been investigated by cathodoluminescence (CL) in the scanning electron microscope (SEM). The samples consist of a powder of particles with sizes of hundreds of nanometers aggregated to form bigger particles of several microns. TEM reveals that the particles consist of nanocrystals with a wide range of sizes including crystallites with dimension of few nanometers. CL spectra of the milled samples show a band at 1.61 eV, attributed to the presence of nanocrystals through a quantum confinement effect. It is suggested that a milling induced infrared emission is related to a high density of extended defects present in the milled samples. | |
dc.description.department | Depto. de Física de Materiales | |
dc.description.faculty | Fac. de Ciencias Físicas | |
dc.description.refereed | TRUE | |
dc.description.status | pub | |
dc.eprint.id | https://eprints.ucm.es/id/eprint/26363 | |
dc.identifier.issn | 1012-0394 | |
dc.identifier.officialurl | http://dx.doi.org/10.4028/www.scientific.net/SSP.78-79.103 | |
dc.identifier.relatedurl | http://www.scientific.net | |
dc.identifier.uri | https://hdl.handle.net/20.500.14352/59137 | |
dc.journal.title | Beam Injection Assessment of Microestructures in Semiconductors, 20 | |
dc.page.final | 109 | |
dc.page.initial | 103 | |
dc.publisher | Trans Tech Publications Ltd | |
dc.rights.accessRights | metadata only access | |
dc.subject.cdu | 538.9 | |
dc.subject.keyword | Oxidized Porous Silicon | |
dc.subject.keyword | Visible Photoluminescence | |
dc.subject.keyword | Luminescence Properties | |
dc.subject.keyword | Optical-Properties | |
dc.subject.keyword | Si | |
dc.subject.keyword | Films | |
dc.subject.keyword | States | |
dc.subject.ucm | Física de materiales | |
dc.title | Cathodoluminescence from nanocrystals in mechanically milled silicon | |
dc.type | journal article | |
dc.volume.number | 78-79 | |
dspace.entity.type | Publication | |
relation.isAuthorOfPublication | b1b44979-3a0d-45d7-aa26-a64b0dbfee18 | |
relation.isAuthorOfPublication | 68dabfe9-5aec-4207-bf8a-0851f2e37e2c | |
relation.isAuthorOfPublication.latestForDiscovery | b1b44979-3a0d-45d7-aa26-a64b0dbfee18 |