Person: Alda Serrano, Javier
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First Name
Javier
Last Name
Alda Serrano
Affiliation
Universidad Complutense de Madrid
Faculty / Institute
Óptica y Optometría
Department
Óptica
Area
Optica
Identifiers
4 results
Search Results
Now showing 1 - 4 of 4
Item Characterization of spatial–temporal patterns in dynamic speckle sequences using principal component analysis(Optical Engineering, 2016) López Alonso, José Manuel; Grumel, Eduardo; Cap, Nelly Lucía; Trivi, Marcelo; Rabal, Héctor; Alda Serrano, JavierAbstract. Speckle is being used as a characterization tool for the analysis of the dynamics of slow-varying phenomena occurring in biological and industrial samples at the surface or near-surface regions. The retrieved data take the form of a sequence of speckle images. These images contain information about the inner dynamics of the biological or physical process taking place in the sample. Principal component analysis (PCA) is able to split the original data set into a collection of classes. These classes are related to processes showing different dynamics. In addition, statistical descriptors of speckle images are used to retrieve information on the characteristics of the sample. These statistical descriptors can be calculated in almost real time and provide a fast monitoring of the sample. On the other hand, PCA requires a longer computation time, but the results contain more information related to spatial–temporal patterns associated to the process under analysis. This contribution merges both descriptions and uses PCA as a preprocessing tool to obtain a collection of filtered images, where statistical descriptors are evaluated on each of them. The method applies to slow-varying biological and industrial processes.Item Maculopatía por puntero láser. ¿Un nuevo problema de salud pública?(Archivos de la Sociedad Española de Oftalmología, 2016) Alda Serrano, Javier; Gómez Sanz, Fernando Javier; González Martín-Moro, JulioItem Measurement limitations in knife-edge tomographic phase retrieval of focused IR laser beams(Optics Express, 2012) Silva López, Manuel; Rico García, José María; Alda Serrano, JavierAn experimental setup to measure the three-dimensional phase-intensity distribution of an infrared laser beam in the focal region has been presented. It is based on the knife-edge method to perform a tomographic reconstruction and on a transport of intensity equation-based numerical method to obtain the propagating wavefront. This experimental approach allows us to characterize a focalized laser beam when the use of image or interferometer arrangements is not possible. Thus, we have recovered intensity and phase of an aberrated beam dominated by astigmatism. The phase evolution is fully consistent with that of the beam intensity along the optical axis. Moreover, this method is based on an expansion on both the irradiance and the phase information in a series of Zernike polynomials. We have described guidelines to choose a proper set of these polynomials depending on the experimental conditions and showed that, by abiding these criteria, numerical errors can be reduced.Item Micromachined silicon lenses for terahertz applications(Infrared Physics & Technology, 2013) Bueno, Juan; López Camacho, Elena; Silva López, Manuel; Rico García, José María; Llombart, N; Alda Serrano, Javier; Costa-Krämer, José LuisSilicon microlenses are a very important tool for coupling terahertz (THz) radiation into antennas and detectors in integrated circuits. They can be used in a large array structures at this frequency range reducing considerably the crosstalk between the pixels. Drops of photoresist have been deposited and their shape transferred into the silicon by means of a Reactive Ion Etching (RIE) process. Large silicon lenses with a few mm diameter (between 1.5 and 4.5 mm) and hundreds of μm height (between 50 and 350 μm) have been fabricated. The surface of such lenses has been characterized using Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM), resulting in a surface roughness of about ∼3 μm, good enough for any THz application. The beam profile at the focal plane of such lenses has been measured at a wavelength of 10.6 μm using a tomographic knife-edge technique and a CO2 laser.