Person: Alda Serrano, Javier
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First Name
Javier
Last Name
Alda Serrano
Affiliation
Universidad Complutense de Madrid
Faculty / Institute
Óptica y Optometría
Department
Óptica
Area
Optica
Identifiers
6 results
Search Results
Now showing 1 - 6 of 6
Item Gold-coated split laser-induced periodic surface structures as refractometric sensors(Optics and Laser Technology, 2022) San Blas, Alejandro; Elshorbagy, Mahmoud Hamdy Mohamed; Olaizola Izquierdo, Santiago M.; Sánchez Brea, Luis Miguel; Rodríguez González, Ainara; Del Hoyo Muñoz, Jesús; Granados, Eduardo; Soria García, Ángela; Pastor Villarrubia, Verónica; Alda Serrano, JavierThe generation of surface plasmon resonances (SPR) in laser-induced periodic surface structures (LIPSS) allows their application in the field of optical sensing, such as the detection of refractive index variations in gases and liquids. We have fabricated gold-coated LIPSS nanostructures on stainless steel substrates by using femtosecond laser nano-ablation. This technique is a low-cost and high-throughput fabrication method applicable to fast and large-scale manufacturing. The depth profile of the fabricated LIPSS shows a central dip at the top of each ripple that split the geometry. The actual topography is modeled and included in a computational electromagnetism package to obtain the expected optical response under the experimental conditions. The measured and simulated spectral reflectances are compared, and the differences are explained by the departure of the fabricated LIPSS from the ideal topography. The experiments and simulations showed excellent agreement for the main spectral characteristics, like the Fano-like lineshapes of the spectral reflectance. This fitting provides the values used to determine the refractometric performance of the fabricated device, that shows a sensitivity of 518 nm/RIU and a figure of merit of 32 RIU−1 for an aqueous analyte. Our experimental results show that the fabricated devices are competitive in terms of cost and simplicity when compared to existing devices with similar performance.Item Characterization of spatial–temporal patterns in dynamic speckle sequences using principal component analysis(Optical Engineering, 2016) López Alonso, José Manuel; Grumel, Eduardo; Cap, Nelly Lucía; Trivi, Marcelo; Rabal, Héctor; Alda Serrano, JavierAbstract. Speckle is being used as a characterization tool for the analysis of the dynamics of slow-varying phenomena occurring in biological and industrial samples at the surface or near-surface regions. The retrieved data take the form of a sequence of speckle images. These images contain information about the inner dynamics of the biological or physical process taking place in the sample. Principal component analysis (PCA) is able to split the original data set into a collection of classes. These classes are related to processes showing different dynamics. In addition, statistical descriptors of speckle images are used to retrieve information on the characteristics of the sample. These statistical descriptors can be calculated in almost real time and provide a fast monitoring of the sample. On the other hand, PCA requires a longer computation time, but the results contain more information related to spatial–temporal patterns associated to the process under analysis. This contribution merges both descriptions and uses PCA as a preprocessing tool to obtain a collection of filtered images, where statistical descriptors are evaluated on each of them. The method applies to slow-varying biological and industrial processes.Item Fabrication effects in the optical performance of DOEs engraved with femtosecond lasers(Proceedings of SPIE, 2021) Soria García, Ángela; Fantova, Jorge; San Blas, Alejandro; Hoyo Muñoz, Jesús del; Sánchez Brea, Luis Miguel; Alda Serrano, Javier; Rodríguez González, Ainara; Olaizola Izquierdo, Santiago M.The development of DOEs fabrication techniques is continuously growing due to the wide range of industrial applications, such as beam manipulation or optical position encoders. In this work, we use Femtosecond laser direct writing to manufacture DOEs, which uses a simpler and more efficient way to fabricate amplitude binary masks. Also, we have analyzed the performance of the DOEs. The fabrication technique is validated since the experimental results are in accordance to numerical simulations.Item Maculopatía por puntero láser. ¿Un nuevo problema de salud pública?(Archivos de la Sociedad Española de Oftalmología, 2016) Alda Serrano, Javier; Gómez Sanz, Fernando Javier; González Martín-Moro, JulioItem Measurement limitations in knife-edge tomographic phase retrieval of focused IR laser beams(Optics Express, 2012) Silva López, Manuel; Rico García, José María; Alda Serrano, JavierAn experimental setup to measure the three-dimensional phase-intensity distribution of an infrared laser beam in the focal region has been presented. It is based on the knife-edge method to perform a tomographic reconstruction and on a transport of intensity equation-based numerical method to obtain the propagating wavefront. This experimental approach allows us to characterize a focalized laser beam when the use of image or interferometer arrangements is not possible. Thus, we have recovered intensity and phase of an aberrated beam dominated by astigmatism. The phase evolution is fully consistent with that of the beam intensity along the optical axis. Moreover, this method is based on an expansion on both the irradiance and the phase information in a series of Zernike polynomials. We have described guidelines to choose a proper set of these polynomials depending on the experimental conditions and showed that, by abiding these criteria, numerical errors can be reduced.Item Micromachined silicon lenses for terahertz applications(Infrared Physics & Technology, 2013) Bueno, Juan; López Camacho, Elena; Silva López, Manuel; Rico García, José María; Llombart, N; Alda Serrano, Javier; Costa-Krämer, José LuisSilicon microlenses are a very important tool for coupling terahertz (THz) radiation into antennas and detectors in integrated circuits. They can be used in a large array structures at this frequency range reducing considerably the crosstalk between the pixels. Drops of photoresist have been deposited and their shape transferred into the silicon by means of a Reactive Ion Etching (RIE) process. Large silicon lenses with a few mm diameter (between 1.5 and 4.5 mm) and hundreds of μm height (between 50 and 350 μm) have been fabricated. The surface of such lenses has been characterized using Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM), resulting in a surface roughness of about ∼3 μm, good enough for any THz application. The beam profile at the focal plane of such lenses has been measured at a wavelength of 10.6 μm using a tomographic knife-edge technique and a CO2 laser.