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Spatial-distribution of luminescence in CdTe wafers

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1994

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Iop Publishing Ltd
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https://hdl.handle.net/20.500.14352/60860

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Abstract

The nature of the 1.4eV band in CdTe is studied by cathodoluminescence. Results indicate that the band is not related only to surface defects.

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© Iop Publishing Ltd. International Conference on Defect Recognition and Image Processing in Semiconductors and Devices (5. 1993. Santander, España)

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Física de materiales

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