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Spatial-distribution of luminescence in CdTe wafers

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1994
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Iop Publishing Ltd
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Abstract
The nature of the 1.4eV band in CdTe is studied by cathodoluminescence. Results indicate that the band is not related only to surface defects.
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© Iop Publishing Ltd. International Conference on Defect Recognition and Image Processing in Semiconductors and Devices (5. 1993. Santander, España)
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