Spatial-distribution of luminescence in CdTe wafers

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dc.book.titleDefect recognition and image processing in semiconductors and devices
dc.contributor.authorPal, U.
dc.contributor.authorFernández Sánchez, Paloma
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorSerrano, M. D.
dc.contributor.authorDiéguez, E.
dc.date.accessioned2023-06-20T21:09:48Z
dc.date.available2023-06-20T21:09:48Z
dc.date.issued1994
dc.description© Iop Publishing Ltd. International Conference on Defect Recognition and Image Processing in Semiconductors and Devices (5. 1993. Santander, España)
dc.description.abstractThe nature of the 1.4eV band in CdTe is studied by cathodoluminescence. Results indicate that the band is not related only to surface defects.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26992
dc.identifier.isbn0-7503-0294-1
dc.identifier.urihttps://hdl.handle.net/20.500.14352/60860
dc.issue.number135
dc.page.final180
dc.page.initial177
dc.page.total4
dc.publisherIop Publishing Ltd
dc.relation.ispartofseriesConference Series- Institute of Physics
dc.rights.accessRightsmetadata only access
dc.subject.cdu538.9
dc.subject.keywordEngineering
dc.subject.keywordElectrical & Electronic
dc.subject.keywordOptics
dc.subject.keywordPhysics
dc.subject.keywordMultidisciplinary
dc.subject.ucmFísica de materiales
dc.titleSpatial-distribution of luminescence in CdTe wafers
dc.typebook part
dspace.entity.typePublication
relation.isAuthorOfPublicationdaf4b879-c4a8-4121-aaff-e6ba47195545
relation.isAuthorOfPublication68dabfe9-5aec-4207-bf8a-0851f2e37e2c
relation.isAuthorOfPublication.latestForDiscoverydaf4b879-c4a8-4121-aaff-e6ba47195545

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