Laser beam profiling with extended-image-range techniques

Abstract

A method to enlarge the dynamic range of a CCD-based laser beam profiler is presented. The method is based on extended-image-range techniques. The algorithm that generates the extended-irradiance-range image is described in detail. An equivalent dynamic range and number of bits are defined and computed for the new profiling system. To test the method, experimental measurements of the principal widths of the output beam from a single-mode optical fiber have been made, as well as the Fraunhofer diffraction pattern of a 200-μm m pinhole back-illuminated by a HeNe laser.